Encyclopedia of Systems and Control

Living Edition
| Editors: John Baillieul, Tariq Samad

Non-raster Methods in Scanning Probe Microscopy

  • Sean B. AnderssonEmail author
Living reference work entry
DOI: https://doi.org/10.1007/978-1-4471-5102-9_100042-1


Scanning probe microscopy (SPM) refers to a family of technologies for probing systems with nanometer-scale features in which a probe interacts with a sample. Traditionally, images of a signal of interest are built pixel-by-pixel by rastering the probe across the sample. While simple, this method is at least partially responsible for the slow imaging times which are inherent to SPM imaging. Non-raster methods seek to improve image acquisition time by modifying this scanning process to one that is more efficient. This efficiency can be with respect to the probe trajectories, moving to patterns that are easier for scanners to follow, or it can be with respect to scanning area, increasing speed by reducing the amount of scanning to be done.


High-speed SPM Non-raster scanning Feature-based imaging 
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Copyright information

© Springer-Verlag London Ltd., part of Springer Nature 2020

Authors and Affiliations

  1. 1.Mechanical Engineering and Division of Systems EngineeringBoston UniversityBostonUSA

Section editors and affiliations

  • S. O. Reza Moheimani
    • 1
  1. 1.University of Texas at DallasDallasUSA