Encyclopedia of Systems and Control

Living Edition
| Editors: John Baillieul, Tariq Samad

Non-raster Methods in Scanning Probe Microscopy

  • Sean B. AnderssonEmail author
Living reference work entry
DOI: https://doi.org/10.1007/978-1-4471-5102-9_100042-1

Abstract

Scanning probe microscopy (SPM) refers to a family of technologies for probing systems with nanometer-scale features in which a probe interacts with a sample. Traditionally, images of a signal of interest are built pixel-by-pixel by rastering the probe across the sample. While simple, this method is at least partially responsible for the slow imaging times which are inherent to SPM imaging. Non-raster methods seek to improve image acquisition time by modifying this scanning process to one that is more efficient. This efficiency can be with respect to the probe trajectories, moving to patterns that are easier for scanners to follow, or it can be with respect to scanning area, increasing speed by reducing the amount of scanning to be done.

Keywords

High-speed SPM Non-raster scanning Feature-based imaging 
This is a preview of subscription content, log in to check access.

Bibliography

  1. Anderson CM, Georgiou GN, Morrison IG, Stevenson GVW, Cherry RJ (1992) Tracking of cell surface receptors by fluorescence digital imaging microscopy using a charge-coupled device camera. J Cell Sci 101(2):415–425Google Scholar
  2. Ando T (2012) High-speed atomic force microscopy coming of age. Nanotechnology 23(6):062001CrossRefGoogle Scholar
  3. Ando T, Uchihashi T, Kodera N (2013) High-speed AFM and applications to biomolecular systems. Ann Rev Biophys 42(1):393–414CrossRefGoogle Scholar
  4. Bazaei A, Yong YK, Moheimani SOR (2017) Combining spiral scanning and internal model control for sequential AFM imaging at video rate. IEEE/ASME Trans Mechatron 22(1):371–380CrossRefGoogle Scholar
  5. Braker RA, Luo Y, Pao LY, Andersson SB (2018) Hardware demonstration of atomic force microscopy imaging via compressive sensing and <tex>μ</tex>-Path scans. In: American Control Conference (ACC), IEEE, pp 6037–6042Google Scholar
  6. Chen A, Bertozzi AL, Ashby PD, Getreuer P, Lou Y (2012) Enhancement and recovery in atomic force microscopy images. In: Excursions in Harmonic Analysis, vol 2, Birkhäuser, Boston, pp 311–332zbMATHGoogle Scholar
  7. Clayton GM, Tien S, Leang KK, Zou Q, Devasia S (2009) A review of feedforward control approaches in nanopositioning for high-speed SPM. J Dyn Syst Measur Control 131(6):061101CrossRefGoogle Scholar
  8. Hartman B, Andersson SB (2018) Feature tracking for high speed AFM imaging of biopolymers. Int J Mol Sci 19(4):1044CrossRefGoogle Scholar
  9. Helfrich BE, Lee C, Bristow DA, Xiao XH, Dong J, Alleyne AG, Salapaka SM, Ferreira PM (2009) Combined H -feedback control and iterative learning control design with application to nanopositioning systems. IEEE Trans Control Syst Technol 18(2):336–351CrossRefGoogle Scholar
  10. Heron JT, Bosse JL, He Q, Gao Y, Trassin M, Ye L, Clarkson JD, Wang C, Liu J, Salahuddin S, Ralph DC, Schlom DG, Íñiguez J, Huey BD, Ramesh R (2014) Deterministic switching of ferromagnetism at room temperature using an electric field. Nature 516(7531):370–373CrossRefGoogle Scholar
  11. Luo Y, Andersson SB (2015) A comparison of reconstruction methods for undersampled atomic force microscopy images. Nanotechnology 26(50):505703CrossRefGoogle Scholar
  12. Rana MS, Pota HR, Petersen IR (2014) Spiral scanning with improved control for faster imaging of AFM. IEEE Trans Nanotechnology 13(3):541–550CrossRefGoogle Scholar
  13. Teo YR, Yong Y, Fleming AJ (2016) A comparison of scanning methods and the vertical control implications for scanning probe microscopy. Asian J Control 28(2):65zbMATHGoogle Scholar
  14. Tuma T, Lygeros J, Kartik V, Sebastian A, Pantazi A (2012) High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories. Nanotechnology 23(18):185501CrossRefGoogle Scholar
  15. Walters DA, Cleveland JP, Thomson NH, Hansma PK, Wendman MA, Gurley G, Elings V (1998) Short cantilevers for atomic force microscopy. Rev Sci Instrum 67(10):3583–3590CrossRefGoogle Scholar
  16. Yong YK, Leang KK (2016) Mechanical design of high-speed nanopositioning systems. In: Nanopositioning technologies. Springer, Cham, pp 61–121CrossRefGoogle Scholar
  17. Yoshioka T, Matsushima H, Ueda M (2018) In situ observation of Cu electrodeposition and dissolution on Au(100) by high-speed atomic force microscopy. Electrochem Commun 92:29–32CrossRefGoogle Scholar
  18. Zhang K, Hatano T, Tien T, Herrmann G, Edwards C, Burgess SC, Miles M (2015a) An adaptive non-raster scanning method in atomic force microscopy for simple sample shapes. Meas Sci Technol 26(3):035401CrossRefGoogle Scholar
  19. Zhang Z, Xu Y, Yang J, Li X, Zhang D (2015b) A survey of sparse representation: algorithms and Applications. IEEE Access 3:490–530CrossRefGoogle Scholar

Copyright information

© Springer-Verlag London Ltd., part of Springer Nature 2020

Authors and Affiliations

  1. 1.Mechanical Engineering and Division of Systems EngineeringBoston UniversityBostonUSA

Section editors and affiliations

  • S. O. Reza Moheimani
    • 1
  1. 1.University of Texas at DallasDallasUSA