Abstract
Microscopes have always been one of the essential instruments for research in the biomedical field. Radiation-based microscopes (such as the light microscope and the electron microscope) have become trustworthy companions in the laboratory and have contributed greatly to our scientific knowledge. However, although digital techniques in recent years have still enhanced their performance, the limits of their inherent capabilities have been progressively reached.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsSpringer Nature is developing a new tool to find and evaluate Protocols. Learn more
References
Binnig, G., Quate, C. F., and Gerber, Ch. (1986) Atomic force microscope. Phys. Rev. Lett. 56, 930–933.
Binnig, G., Gerber, C., Stoll, E., Albrecht, T. R., and Quate, C. F. (1987) Atomic resolution with the atomic force microscope. Europhys. Lett. 3, 1281–1286.
Hug, H. J., Lantz, M. A., Abdurixit, A., et al. (2001) Subatomic features in atomic force microscopy images. Science 291, 2509.
Jarvis, M. R., Perez, R., and Payne, M. C. (2001) Can atomic force microscopy achieve atomic resolution in contact mode? Phys. Rev. Lett. 86, 1287–1290.
Alexander, S., Hellemans, L., Marti, O., et al. (1989) An atomic-resolution atomic-force microscope implemented using an optical lever. J. Appl. Phys. 65, 164–167.
Albrecht, T. R., Akamine, S., Carver, T.E., and Quate, C. F. (1990) Microfabrication of cantilever styli for the atomic force microscope. J. Vac. Sci. Technol. A 8, 3386–3396.
Tortonese, M. (1997). Cantilevers and tips for atomic force microscopy. IEEE Engl. Med. Biol. Mag. 16, 28–33.
Sheng, S., Czajkowsky, D. M., and Shao, Z. (1999) AFM tips: How sharp are they? J. Microsc. 196, 1–5.
Cleveland, J. P., Manne, S., Bocek, D., and Hansma, P. K. (1993) A non-destructive method for determining the spring constant of cantilevers for scanning force microscopy. Rev. Sci. Instrum. 64, 403–405.
Meyer, G. and Amer, N. M. (1988) Novel approach to atomic force microscopy. Appl. Plrys. Lett. 53, 1045–1047.
Baselt, D. R., Clark, S. M., Youngquist, M. G., Spence, C. F., and Baldeschwieler, J. D. (1993) Digital signal control of scanned probe microscopes. Rev. Sci. Instrum. 64, 1874–1882.
Wade, T., Garst, J. F., and Stickney, J. L. (1999). A simple modification of a commercial atomic force microscopy liquid cell for in situ imaging in organic, reactive or air sensitive environments. Rev. Sci. Instr. 70, 121–124.
Lehenkari, P. P., Charras, G. T., Nykanen, A., and Horton, M. A. (2000) Adapting atomic force microscopy for cell biology. Ultramicroscopy 82, 289–295.
Workman, R. K. and Manne, S. (2000) Variable temperature fluid stage for atomic force microscopy. Rev. Sci. Instrum. 71, 431–436.
Radmacher, M., Cleveland, J. P., and Hansma, P. K. (1995) Improvement of thermally induced bending of cantilevers used for atomic force microscopy. Scanning 17, 117–121.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2004 Humana Press Inc., Totowa, NJ
About this protocol
Cite this protocol
Ricci, D., Braga, P.C. (2004). How the Atomic Force Microscope Works. In: Braga, P.C., Ricci, D. (eds) Atomic Force Microscopy. Methods in Molecular Biology™, vol 242. Humana Press. https://doi.org/10.1385/1-59259-647-9:3
Download citation
DOI: https://doi.org/10.1385/1-59259-647-9:3
Publisher Name: Humana Press
Print ISBN: 978-1-58829-094-6
Online ISBN: 978-1-59259-647-8
eBook Packages: Springer Protocols