Abstract
Since late 1980s, the whole-cell patch-clamp technique has been used as a powerful tool for analyzing local circuits of the central nervous system in a brain slice preparation in which the fundamental architecture of local circuits is mostly maintained. When combined with intracellular staining techniques, the technique allows high-resolution analysis of the membrane and the synaptic and morphological properties of the recorded cells. We offer a brief introduction to slice patch-clamp recording, including acute slice preparation, selection of intracellular and extracellular solutions, techniques for forming giga-ohm seals and whole-cell recordings, and staining of the recorded neurons. Much effort has gone into describing a number of small but important technical issues that can be useful for beginners attempting this technique.
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Notes
- 1.
It is often difficult to clamp the whole membrane potential of neurons with their complex shape through all of the soma and elongated dendrites. It is referred to as a “space clamp problem.”
References
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Isa, T., Imoto, K., Kawaguchi, Y. (2012). Slice Patch Clamp. In: Okada, Y. (eds) Patch Clamp Techniques. Springer Protocols Handbooks. Springer, Tokyo. https://doi.org/10.1007/978-4-431-53993-3_7
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DOI: https://doi.org/10.1007/978-4-431-53993-3_7
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-53992-6
Online ISBN: 978-4-431-53993-3
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