Volume 5, Issue 4

Search all Nanomanufacturing and Metrology articles

December 2022

28 articles in this issue

Foreword to the Special Issue on the 7th International Conference on Nanomanufacturing (nanoMan2021)
Shuming Yang
Zhuangde Jiang
Foreword 10 November 2022 Pages: 325 - 326
Adaptive Thermoforming and Structural Design of Millimeter-Wave Antenna Panels
Zack Hatfield
Alex St. Peter
Justin Hyatt
Original Article Open access 23 October 2022 Pages: 327 - 335
Plowing-Extrusion Processes and Performance of Functional Surface Structures of Copper Current Collectors for Lithium-Ion Batteries
Chun Wang
Wei Yuan
Mingyue Chen
Original Article Open access 15 May 2022 Pages: 336 - 353
Numerical Analysis of Microchannels Designed for Heat Sinks
Matthew McCormack
Fengzhou Fang
Jufan Zhang
Original Article Open access 11 November 2021 Pages: 354 - 369
Capillary Performance of Nanoporous Aluminum Braided Wicks Prepared by Anodic Oxidation
Fei Gao
Longsheng Lu
Yingxi Xie
Original Article Open access 24 April 2022 Pages: 370 - 380
Impact of Pulsed Laser Parameters and Scanning Pattern on the Properties of Thin-Walled Parts Manufactured Using Laser Metal Deposition
Weiwei Liu
Gamal Al-Hammadi
Zhidong Zhang
Original Article Open access 02 November 2022 Pages: 381 - 393
Precision Milling of Integrated Turbine Based on a Non-Contact On-Machine Measurement System
Ying Wang
Tianfeng Zhou
Xibin Wang
Original Article 21 July 2022 Pages: 394 - 402
Profile Compensation for Single-Point Diamond Turning of Microlens Array
Zhiyue Wang
Zaozao Chen
Xinquan Zhang
Original Article 08 August 2022 Pages: 403 - 411
Correction of Interferometric High-Order Nonlinearity Error in Metrological Atomic Force Microscopy
Gaoliang Dai
Xiukun Hu
Original Article Open access 06 October 2022 Pages: 412 - 422
Suppression Strategy of Micro-waviness error in Ultra-precision Parallel Grinding
Shanshan Chen
Shuming Yang
Feihu Zhang
Original Article 07 April 2022 Pages: 423 - 429
Correction: A Comprehensive FIB Lift-out Sample Preparation Method for Scanning Probe Microscopy
F. Ji
Y. Yao
J. Seidel
Correction 24 November 2022 Pages: 430 - 430
Correction: In-Process Diameter Measurement Technique for Micro-optical Fiber with Standing Wave Illumination
Masaki Michihata
Zhao Zheng
Satoru Takahashi
Correction Open access 23 November 2022 Pages: 431 - 431
Correction: Design and Development of Oblique-Incident Interferometer for Form Measurement of Hand-Scraped Surfaces
So Ito
Daiki Kameoka
Kazuhide Kamiya
Correction 23 November 2022 Pages: 432 - 432
Correction: Measurement Method of Internal Residual Stress in Plastic Parts Using Terahertz Spectroscopy
Yusuke Kajihara
Rio Takahashi
Shigeo Miyake
Correction 23 November 2022 Pages: 433 - 433
Correction: DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images
Hongchu Du
Correction Open access 23 November 2022 Pages: 434 - 434
Correction: Ghost Imaging with Deep Learning for Position Mapping of Weakly Scattered Light Source
Yasuhiro Mizutani
Shoma Kataoka
Yasuhiro Takaya
Correction Open access 13 December 2022 Pages: 435 - 435
Correction: Active Air Venting of Mold Cavity to Improve Performance of Injection Molded Direct Joining
Fuminobu Kimura
Shotaro Kadoya
Yusuke Kajihara
Correction 23 November 2022 Pages: 436 - 436
Correction: Fundamental Investigations in the Design of Five-Axis Nanopositioning Machines for Measurement and Fabrication Purposes
Ralf Schienbein
Florian Fern
Eberhard Manske
Correction Open access 13 December 2022 Pages: 437 - 437
Correction: Additive Manufacturing of Metal Micro-ring and Tube by Laser-Assisted Electrophoretic Deposition with Laguerre–Gaussian Beam
Kenta Nakazawa
Syunya Ozawa
Futoshi Iwata
Correction 19 November 2022 Pages: 438 - 438
Correction: Closed-Loop Control of an XYZ Micro-Stage and Designing of Mechanical Structure for Reduction in Motion Errors
Hiraku Matsukuma
Keisuke Adachi
Yoshihiro Sasaki
Correction 23 November 2022 Pages: 439 - 439
Correction: Comparison of EUV Photomask Metrology Between CD-AFM and TEM
Gaoliang Dai
Kai Hahm
Markus Heidelmann
Correction Open access 24 November 2022 Pages: 440 - 440
Correction: A Proposal of a Spline Filter that Achieves Both Robustness and Lower Compatibility
Yuki Kondo
Munetoshi Numada
Hiroyasu Koshimizu
Correction 13 December 2022 Pages: 441 - 441
Correction: A Proposal of Hyperbolic Fitting Method by Applying the Properties of Functions for Plateau Surface Analysis in ISO 13565–3
Ryo Sakakibara
Ichiro Yoshida
Kenichi Yamashita
Correction 23 November 2022 Pages: 442 - 442
Correction: Verification of Characteristics of Gaussian Filter Series for Surface Roughness in ISO and Proposal of Filter Selection Guidelines
Yuki Kondo
Ichiro Yoshida
Hiroyasu Koshimizu
Correction 23 November 2022 Pages: 443 - 443
Correction: Flexible Evanescent Wave Interference Lithography System for Sub-half-Wavelength Complex Relief Structures Fabrication
Yuki Torii
Shuzo Masui
Satoru Takahashi
Correction 23 November 2022 Pages: 444 - 444
Correction: Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan
Ichiko Misumi
Ryosuke Kizu
Tomoo Sigehuzi
Correction Open access 23 November 2022 Pages: 445 - 445
Correction to: Indirect Measurement Methods for Quality and Process Control in Nanomanufacturing
Zhaoyan Fan
Xiaochen Hu
Robert X. Gao
Correction Open access 13 December 2022 Pages: 446 - 446
Correction: Pure Metal Clusters with Atomic Precision for Nanomanufacturing
Haiming Wu
Hanyu Zhang
Zhixun Luo
Correction Open access 23 November 2022 Pages: 447 - 447

Volume 5, Issue 4

Foreword to the Special Issue on the 7th International Conference on Nanomanufacturing (nanoMan2021)

Adaptive Thermoforming and Structural Design of Millimeter-Wave Antenna Panels

Plowing-Extrusion Processes and Performance of Functional Surface Structures of Copper Current Collectors for Lithium-Ion Batteries

Numerical Analysis of Microchannels Designed for Heat Sinks

Capillary Performance of Nanoporous Aluminum Braided Wicks Prepared by Anodic Oxidation

Impact of Pulsed Laser Parameters and Scanning Pattern on the Properties of Thin-Walled Parts Manufactured Using Laser Metal Deposition

Precision Milling of Integrated Turbine Based on a Non-Contact On-Machine Measurement System

Profile Compensation for Single-Point Diamond Turning of Microlens Array

Correction of Interferometric High-Order Nonlinearity Error in Metrological Atomic Force Microscopy

Suppression Strategy of Micro-waviness error in Ultra-precision Parallel Grinding

Correction: A Comprehensive FIB Lift-out Sample Preparation Method for Scanning Probe Microscopy

Correction: In-Process Diameter Measurement Technique for Micro-optical Fiber with Standing Wave Illumination

Correction: Design and Development of Oblique-Incident Interferometer for Form Measurement of Hand-Scraped Surfaces

Correction: Measurement Method of Internal Residual Stress in Plastic Parts Using Terahertz Spectroscopy

Correction: DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images

Correction: Ghost Imaging with Deep Learning for Position Mapping of Weakly Scattered Light Source

Correction: Active Air Venting of Mold Cavity to Improve Performance of Injection Molded Direct Joining

Correction: Fundamental Investigations in the Design of Five-Axis Nanopositioning Machines for Measurement and Fabrication Purposes

Correction: Additive Manufacturing of Metal Micro-ring and Tube by Laser-Assisted Electrophoretic Deposition with Laguerre–Gaussian Beam

Correction: Closed-Loop Control of an XYZ Micro-Stage and Designing of Mechanical Structure for Reduction in Motion Errors

Correction: Comparison of EUV Photomask Metrology Between CD-AFM and TEM

Correction: A Proposal of a Spline Filter that Achieves Both Robustness and Lower Compatibility

Correction: A Proposal of Hyperbolic Fitting Method by Applying the Properties of Functions for Plateau Surface Analysis in ISO 13565–3

Correction: Verification of Characteristics of Gaussian Filter Series for Surface Roughness in ISO and Proposal of Filter Selection Guidelines

Correction: Flexible Evanescent Wave Interference Lithography System for Sub-half-Wavelength Complex Relief Structures Fabrication

Correction: Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan

Correction to: Indirect Measurement Methods for Quality and Process Control in Nanomanufacturing

Correction: Pure Metal Clusters with Atomic Precision for Nanomanufacturing

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