Nanomanufacturing and Metrology
Description
The first issue of the journal will be published on March 1st, 2018.
This international, interdisciplinary research journal offers the first forum dedicated to research in nano-manufacturing and nano-metrology.
Nanomanufacturing and Metrology presents original articles, cutting-edge communications, timely review papers, technical reports, and case studies. The journal will also publish special issues devoted to developments in important topics in nano-manufacturing and metrology.
Coverage spans the field, including topics related to:
• Manufacturing and metrology at the micro-, nano- and atomic levels
• Physics, chemistry, and materials used in micro-, nano- and atomic manufacturing and metrology
• Tools and processes for nano-manufacturing and nano-metrology
Latest Articles
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Review Papers
Promising Lithography Techniques for Next-Generation Logic Devices
Rashed Md. Murad Hasan, Xichun Luo (April 2018)
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Original Articles
Surface Quality Evaluation in Orthogonal Turn-Milling Based on Box-Counting Method for Image Fractal Dimension Estimation
Zhongke Niu, Li Jiao, Shiqi Chen, Pei Yan, Xibin Wang (April 2018)
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Original Article
In-Process Measurement of Thickness of Cured Resin in Evanescent-Wave-Based Nano-stereolithography Using Critical Angle Reflection
Deqing Kong, Masaki Michihata, Kiyoshi Takamasu… (April 2018)

- Available 2018 - 2018
- Volumes 1
- Issues 1
- Articles 15
- Open Access 3 Articles
Stay up to Date
Find a Volume or Issue
- Journal Title
- Nanomanufacturing and Metrology
- Coverage
- Volume 1 / 2018
- Print ISSN
- 2520-811X
- Online ISSN
- 2520-8128
- Publisher
- Springer Singapore
- Additional Links
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