Investigation of hole-free phase plate performance in transmission electron microscopy under different operation conditions by experiments and simulations Rebecca PretzschManuel DriesDagmar Gerthsen Research Open access 01 October 2019 Article: 5
Optimal principal component analysis of STEM XEDS spectrum images Pavel PotapovAxel Lubk Research Open access 09 April 2019 Article: 4
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Fast approximate STEM image simulations from a machine learning model Aidan H. CombsJason J. MaldonisDane Morgan Research Open access 12 March 2019 Article: 2
Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope Cheng SunErich MüllerDagmar Gerthsen Research Open access 09 March 2019 Article: 1