Cesium profiles in silicon and in SiO2-Si double-layers as determined by SIMS measurements A. HurrleG. Sixt Contributed Papers Pages: 293 - 302
On the chemical erosion of a carbon first wall proposed for Tokamak devices for controlled nuclear fusion S. VeprekM. R. Haque Contributed Papers Pages: 303 - 309
Search for efficient, near UV lasing dyes. I. Substituent effects on bicyclic dyes P. R. HammondA. N. FletcherR. L. Atkins Contributed Papers Pages: 311 - 314
Search for efficient, near UV lasing dyes. II. Aza substitution in bicyclic dyes P. R. HammondA. N. FletcherR. L. Atkins Contributed Papers Pages: 315 - 318
Formation and nature of swirl defects in silicon H. FöllB. O. Kolbesen Contributed Papers Pages: 319 - 331
Infrared stimulated Raman generation: Effects of gain focussing on threshold and tuning behaviour D. CotterD. C. HannaR. Wyatt Contributed Papers Pages: 333 - 340
A high-sensitivity laser microprobe mass analyzer F. HillenkampE. UnsöldR. Nitsche Contributed Papers Pages: 341 - 348
Propagation of sound and spectrally resolved rayleigh scattering in weakly ionized plasmas J. Kopainsky Contributed Papers Pages: 349 - 357
Depth-profiling of Cu-Ni sandwich samples by secondary ion mass spectrometry W. O. HoferH. Liebl Letter Papers Pages: 359 - 360
Effect of residual oxygen on the formation of molecular ions in secondary ion mass spectrometry M. Prager Letter Papers Pages: 361 - 362
