Thermal emission of electrons from highly excited sodium clusters R. SchlipperR. KuscheH. Haberland Pages: 255 - 259
IR double-resonance spectroscopy applied to the 4-aminophenol(H2O)1 cluster M. GerhardsC. Unterberg Pages: 273 - 279
Electronic stopping in ion–fullerene collisions T. SchlathölterO. HadjarR. Morgenstern Pages: 281 - 287
Deposition of endohedral fullerenes from a laser evaporation cluster source M. NeebR. KlingelerW. Eberhardt Pages: 289 - 293
Soft X-ray fluorescence and photoluminescence of Si nanocrystals embedded in SiO2 G.S. ChangJ.H. SonD.L. Ederer Pages: 303 - 306
Are protons involved in the hydrogen-induced surface conductivity of diamond(001)? B. KoslowskiS. StrobelP. Ziemann Pages: 311 - 317
Nanoindentation hardness measurements using real-shape indenters: application to extremely hard and elastic materials E. MartínezJ. Esteve Pages: 319 - 324
Oxygen and hydrogen accumulation at buried implantation-damage layers in hydrogen- and helium-implanted Czochralski silicon R. JobA.G. UlyashinL. Palmetshofer Pages: 325 - 332
Magnetic and high-pressure magnetotransport properties of cesium-substituted lanthanum calcium manganites G. SrinivasanT.P. MullinM.S. Seehra Pages: 333 - 339
Nanoscopic measurements of the electrostriction responses in P(VDF/TrFE) ultra-thin-film copolymer using atomic force microscopy K. El HamiH. YamadaK. Matsushige Pages: 347 - 350
Integrity of ultrathin gate oxides with different oxide thickness, substrate wafers and metallic contaminations R. HölzlA. HuberM. Blietz Pages: 351 - 356
Determination of surface diffusion parameters of Pd on sapphire from SEM measurements of morphological changes of beaded films Á. ImreD.L. Beke Pages: 357 - 360
Angular-dependent photoemission studies of indium tin oxide surfaces W. SongS.K. SoL. Cao Pages: 361 - 365
Multilayer model of interlayer spacing in graphite intercalation compounds T.-R. ParkS.S. Rhee Pages: 367 - 372
Characterization of a growth-front interface in a HPHT-grown diamond crystal by transmission electron microscopy L.W. YinM.S. LiZ.Y. Yao Rapid communication Pages: 373 - 375
F2-laser ablation patterning of dielectric layers D. SchäferJ. IhlemannP.R. Herman Rapid communication Pages: 377 - 379