Microcavity dynamics during laser-induced spallation of liquids and gels G. PaltaufH. Schmidt-Kloiber OriginalPaper Pages: 303 - 311
Ionic character of SrF2-B2O3-GeO2-SiO2 glasses for viscous flow and their applications to MOS capacitors K. KobayashiI. Mizushima OriginalPaper Pages: 313 - 315
Investigation of ultrathin iron and iron/nickel layers prepared from Langmuir-Blodgett films T. FaldumW. MeiselP. Gütlich OriginalPaper Pages: 317 - 322
Theoretical analysis of the surface thermal wave technique for measuring the thermal diffusivity of thin slabs B. ZhangR. E. Imhof OriginalPaper Pages: 323 - 334
Nature of the surface layer in ABO3-type perovskites at elevated temperatures K. SzotM. PawelczykJ. Dec OriginalPaper Pages: 335 - 343
On the recombination behaviour of iron in moderately boron-doped p-type silicon D. WalzJ. -P. MyG. Kamarinos OriginalPaper Pages: 345 - 353
Boron electrical activation in dual B+ + N+ + and B+ + Ar+ ion-implanted silicon V. B. OdzhaevV. N. PopokV. Hnatowicz OriginalPaper Pages: 355 - 358
On the redistribution of6Li + ions implanted into polypropylene foils D. FinkM. BeharL. Wang OriginalPaper Pages: 359 - 367
Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images D. StenkampH. P. Strunk OriginalPaper Pages: 369 - 372
Growth enhancement of UF5 nano-particles assisted byα-ray ionization Y. KugaS. IsomuraK. Okuyama OriginalPaper Pages: 373 - 379
L X-ray fluorescence cross sections and yields for mediumZ elements in the energy region 5.47 ≤E ≤ 9.36 keV D. V. RaoR. CesareoG. E. Gigante OriginalPaper Pages: 381 - 386
Raman spectroscopy of strained GeSi alloys deposited on Ge substrates S. GuL. QinY. Zheng OriginalPaper Pages: 387 - 390
Electrical characteristics of the rf-excited oxygen plasma-cathodization-grown SiO2/Si interface Z. X. LiangZ. S. HanL. C. Wang OriginalPaper Pages: 391 - 395