Dynamics of excimer laser ablation of thin tungsten films monitored by ultrafast photography Z. TóthB. HoppZ. Bor OriginalPaper Pages: 431 - 436
Effect of annealing on the electrical properties and refractive index of HgI2 single crystals M. H. AbdallahY. RamadenA. M. Zihlif OriginalPaper Pages: 437 - 440
In-situ monitoring of interface formation using the phase shift of reflection high-energy electron diffraction intensity oscillations W. BraunK. Ploog OriginalPaper Pages: 441 - 446
Positron mobility in polyethylene in the 60–400 K temperature range R. S. BrusaM. Duarte NaiaA. Zecca OriginalPaper Pages: 447 - 453
The impulse photopyroelectric method for thermal characterization of electrically conducting polymers A. FrandasH. JalinkM. Brie OriginalPaper Pages: 455 - 458
Surface and bulk properties of hot-pressed PbMo6S8 superconductor studied by Auger electron spectroscopy and calorimetry P. SelvamJ. CorsØ. Fischer OriginalPaper Pages: 459 - 465
Effect of electric field on deep centers in Si∶V studied by spectral analysis of capacitance transients H. KawaharaY. OkamotoT. Miyakawa OriginalPaper Pages: 467 - 474
High-transparency films for nonlinear integrated optics based on P(VDF-TrFE) and poly(α-methyl styrene) host materials A. BürgelW. KleemannH. Franke OriginalPaper Pages: 475 - 480
Microstructure of polycarbonate seen by positrons as an in-situ probe R. RamaniP. RamachandraC. Ranganathaiah OriginalPaper Pages: 481 - 486
On the presence of spatial pattern formation in a bistable dynamical system E. FinkeD. Simon OriginalPaper Pages: 487 - 495
Polymer photoablation under windowless VUV hydrogen or helium discharge lamp C. FuchsO. GoetzbergerE. Fogarassy OriginalPaper Pages: 505 - 507
Photo-magneto-electric effect in semi-insulating GaAs: carrier lifetimes and influence of the defect structure V. Kažukauskas OriginalPaper Pages: 509 - 514
Permittivity and AC conductivity in yttria-stabilized zirconia F. E. G. HennR. M. BuchananD. A. Stevenson OriginalPaper Pages: 515 - 519
Structural evolution during lithiation of sputtered V2O5 films A. TalledoC. G. Granqvist Rapid Communications Pages: 521 - 522
Note on the interpretation of injection-level-dependent surface recombination velocities R. Brendel Rapid Communications Pages: 523 - 524