Nitrogen-oxygen complexes in Czochralski-silicon P. WagnerR. OederW. Zulehner Solids and Materials Pages: 73 - 76
Surface and volume decay processes in semiconductors studied by contactless transient photoconductivity measurements M. KunstG. MüllerH. Wetzel Solids and Materials Pages: 77 - 85
X-ray Photoelectron Spectroscopy of silicon oxynitride layers obtained by low-energy ion implantation O. BenkherourouJ. P. Deville Solids and Materials Pages: 87 - 90
Raman spectroscopy of carbonization films and carbonaceous limiters in fusion vessels J. DünnwaldJ. WinterA. Otto Solids and Materials Pages: 91 - 96
Relaxation oscillators made of bridge-type Josephson contacts M. MückH. RogallaC. Heiden Solids and Materials Pages: 97 - 101
Plasma — Processed obliquely deposited Bi-Ge-Se and Ag/Bi-Ge-Se films as resist materials P. K. GuptaK. L. Chopra Solids and Materials Pages: 103 - 106
Optical and structural properties of polycrystalline CdSe deposited on titanium substrates F. CerdeiraI. TorrianiF. Decker Solids and Materials Pages: 107 - 112
Threshold switching effects in AgTlSe2 and CuTlSe2 films M. A. AfifiH. H. A. LabibK. A. Sharaf Solids and Materials Pages: 113 - 117
LEED investigations on pure and metal treated vicinal silicon(111) F. JentzschM. Henzler Surfaces, Interfaces, and Layer Structures Pages: 119 - 123
Tin-related shallow donor in indium selenide B. MaríA. SeguraA. Chevy Surfaces, Interfaces, and Layer Structures Pages: 125 - 129
Stability of liquid-metal ion sources V. V. VladimirovV. N. Gorshkov Surfaces, Interfaces, and Layer Structures Pages: 131 - 136
Verification of CuInSe2 density of states features by reflection electron energy loss spectroscopy Ch. KleintM. FunkeR. D. Tomlinson Surfaces, Interfaces, and Layer Structures Pages: 137 - 143
Influence of surface roughness on adsorbate mobility R. BłaszczyszynCh. Kleint Surfaces, Interfaces, and Layer Structures Pages: 145 - 151
The defect structure of the high-T c superconductors in the system Bi-Ca-Sr-Cu-O G. Van TendelooH. W. ZandbergenS. Amelinckx Rapid Communication Pages: 153 - 158