10th Working Conference on Applied Surface Analysis (AOFA 10) Kaiserslautern, 6–10 September 1998 H. OechsnerHubert Gnaser Editorial Pages: 1 - 2
Recent instrumental developments in magnetic sector SIMS M. SchuhmacherB. RasserH.-N. Migeon Original paper Pages: 12 - 18
Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis H. SchwenkeP. A. BeavenJ. Knoth Original paper Pages: 19 - 27
Electron spectroscopy applied to metastable ceramic solution phases R. CremerMirjam WitthautDieter Neuschütz Original paper Pages: 28 - 37
Combined atom probe and STM study of tip-substrate interactions A. FianCh. ErnstM. Leisch Original paper Pages: 38 - 42
Quantitative comparison of ATR-IR spectra of LB and bulk layers of 22-tricosenic acid on inorganic supports G. MüllerC. Riedel Original paper Pages: 43 - 47
Peak shape analysis of core level photoelectron spectra using UNIFIT for WINDOWS R. HesseT. ChasséR. Szargan Original paper Pages: 48 - 54
Investigations to calibrate reference standards for the thickness of coatings T. AhbeK. HascheK. Thiele Original paper Pages: 55 - 58
Factor analysis and XPS-data preprocessing for non-conducting samples S. OswaldS. Baunack Original paper Pages: 59 - 62
Robust automated three-dimensional segmentation of secondary ion mass spectrometry image sets M. WolkensteinT. StubbingsH. Hutter Original paper Pages: 63 - 69
Operation and application of a laser mass analyser (LASMA) for multielement analysis D. M. WollM. WahlH. Oechsner Original paper Pages: 70 - 75
Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM R. ReicheS. OswaldK. Wetzig Original paper Pages: 76 - 82
Ultra thin film sputter depth profiling J. F. MoulderS. R. BryanU. Roll Original paper Pages: 83 - 84
Quantitative analysis of silicon- and aluminium-oxynitride films with EPMA, SIMS, hf-SNMS, hf-GD-OES and FT-IR S. Dreer Original paper Pages: 85 - 95
Investigations of local electrical surface characteristics by dynamical scanning force microscopy M. HietscholdF. MüllerE. Zschech Original paper Pages: 96 - 98
Stepped current electromigration test of multilevel aluminum metallizations on wafer level M. StrasserM. SchneegansR. Frahm Original paper Pages: 99 - 102
Application of infrared reflection spectroscopy for the analysis of hard coatings on metallic substrates P. HegerG. Marx Original paper Pages: 103 - 105
XPS analysis of the degradation of Nafion M. SchulzeM. LorenzE. Gülzow Original paper Pages: 106 - 113
Water uptake of quartz investigated by means of ion-beam analysis O. DerschF. Rauch Original paper Pages: 114 - 116
SIMS depth profiling, line scanning and imaging analyses of the oxide layer on in-reactor corroded cladding specimens with high lateral resolution O. Gebhardt Original paper Pages: 117 - 122
Characterization of polymers in PEFC-electrodes with EDX and XPS M. SchulzeM. v. BradkeE. Gülzow Original paper Pages: 123 - 132
Raman spectroscopy of C-, BN-, SiC-layers deposited on multifilament substrates N. MeyerK. NestlerG. Marx Original paper Pages: 133 - 135
Surface analytical investigation of the electrochemical and corrosion behaviour of nanocrystalline FeAl8 A. JohnW. ZeigerS. Oswald Original paper Pages: 136 - 141
SIMS Analysis of the wear of boron nitride tools for the machining of compacted graphite iron and grey cast iron M. GastelU. ReuterH. M. Ortner Original paper Pages: 142 - 146
A photoelectrochemical study of anodic oxides on lead selenide surfaces in alkaline solutions H. MeinckeD. G. EblingH. Böttner Original paper Pages: 147 - 149
Study of the surface composition of vanadyl pyrophosphate catalysts by XPS and ISS – Influence of Cs+ and water vapor on the surface P/V ratio of (VO)2P2O7 catalysts F. RichterH. PappB. Kubias Original paper Pages: 150 - 153
XPS analysis of electrochemically oxidized nickel surfaces M. LorenzM. Schulze Original paper Pages: 154 - 157
Surface and interface analysis of PVD Al-O-N and γ-Al2O3 diffusion barriers R. CremerM. WitthautD. Neuschütz Original paper Pages: 158 - 162
Scanning electrochemical microscopy of enzymes immobilized on structured glass-gold substrates T. WilhelmG. WittstockR. Szargan Original paper Pages: 163 - 167
The dependence of fractal dimension on measuring conditions of scanning probe microscopy W. ZahnA. Zösch Original paper Pages: 168 - 172
Surface characterisation of laser irradiated SiC ceramics by AES and XPS S. BaunackS. OswaldT. Temme Original paper Pages: 173 - 177
Potassium and oxygen diffusion and segregation in nickel M. SchulzeR. ReissnerM. Lorenz Original paper Pages: 178 - 182
Material removal and chemical and structural changes induced by irradiation of polymer surfaces with KrF-excimer laser radiation D. A. WesnerM. AdenE. W. Kreutz Original paper Pages: 183 - 187
Application of scanning SIMS techniques for the evaluation of the oxidation behavior of high-purity molybdenum M. GritschC. BrunnerH. P. Martinz Original paper Pages: 188 - 194
The influence of ion beam sputtering on the composition of the near-surface region of silicon carbide layers G. EckeR. KosibaH. Rößler Original paper Pages: 195 - 198
Characterization of transition metal nitride formation in rapid thermal processing (RTP) Ivan GalesicB. O. Kolbesen Original paper Pages: 199 - 202
Effect of surface oxidation on the solution of hydrogen in vanadium G. KissH. PaulusJ. Giber Original paper Pages: 203 - 207
Depth profile and microscopic structure of gold-implanted aluminum using X-ray spectroscopies K. BaurJ. Hormes Original paper Pages: 208 - 211
Studies of polycrystalline materials by Pseudo Kossel technique E. LangerS. DäbritzW. Hauffe Original paper Pages: 212 - 216
High-resolution analytical transmission electron microscopy of semiconductor quantum structures R. SchneiderH. KirmseW. Neumann Original paper Pages: 217 - 220
EPMA sputter depth profiling of an InGaAs-InP heterostructure S. RichterPeter Karduck Original paper Pages: 221 - 226
Structural and optical properties of thin silver films deposited on Si(111) A. MastenM. BrüggemannP. Wißmann Original paper Pages: 227 - 230
SEM and AES depth profile studies of thin titanium and titanium oxide films covered by nanoscale evaporated Au layers A. H. J. van den BergW. LisowskiM. Smithers Original paper Pages: 231 - 235
Examinations on the morphology of tarnish layers grown on stainless 18–10 chromium nickel steels G. PajonkH. Bubert Original paper Pages: 236 - 243
XANES and XPS characterization of hard amorphous CSixNy thin films grown by RF nitrogen plasma assisted pulsed laser deposition T. ThärigenD. MayerR. Szargan Original paper Pages: 244 - 248
Investigation of the properties of a-C:H coatings with graded metal interlayers M. NötheA. BuuronH. Bolt Original paper Pages: 249 - 254
Characterisation of boron nitride fibre coatings with different crystalline order by TEM and XPS D. DietrichS. StöckelG. Marx Original paper Pages: 255 - 257
Analysis of Co and Cr dopants in epitaxial films of β-FeSi2 by ERDA, RBS, EDX and AES W. BohneG.-U. ReinspergerI. Urban Original paper Pages: 258 - 262
Morphology and structure of nanoscale Co-Cu multilayers J. ThomasK. BrandK. Wetzig Original paper Pages: 263 - 268