SIMS depth profiling of vertical p-channel Si-MOS transistor structures U. ZastrowR. LooL. Vescan Original paper Pages: 203 - 207
Depth profile analysis of thin film solar cells using SNMS and SIMS M. GastelU. BreuerH. Wagner Original paper Pages: 207 - 210
New insights into the ZnO/a-SiC:H(B) interface using XPS analysis E. BöhmerF. SiebkeH. Wagner Original paper Pages: 210 - 213
Application of RF GDMS for trace element analysis of nonconducting La0.65Sr0.3MnO3 ceramic layers R. JägerJ. S. BeckerJ. A. C. Broekaert Original paper Pages: 214 - 217
Investigation of water diffusion into quartz using ion beam analysis techniques O. DerschA. ZouineJ. E. Ericson Original paper Pages: 217 - 219
Topographical and microanalytical investigation of corrosion processes on the solid material in the system metal-metalloid glassy alloy (Fe,Cr)80(P,C,Si)20, aqueous FeCl3 solution, and air in the region of the “amorphous solid/liquid/air” phase interface K. ForkelC. KöcherP. J. M. Bartos Original paper Pages: 219 - 224
Plasma SNMS investigations on powder metallurgical Cr and Ti-48Al-2Cr after oxidation in air and 15N2/18O2 atmosphere H. JenettJ. D. SunderkötterM. F. Stroosnijder Original paper Pages: 225 - 229
Oxidation behavior of mechanically alloyed chromium based alloys U. v. d. CroneM. HänselR. Vaßen Original paper Pages: 230 - 232
Investigation of the synthesis and internal structure of protective oxide layers on high-purity chromium with SIMS scanning techniques C. BrunnerH. HutterM. Grasserbauer Original paper Pages: 233 - 236
Experiments on the analysis of thick, non-conductive metallic oxide layers on sheet using HF-SNMS D. SommerAlfons EssingHerbert Patotzki Original paper Pages: 236 - 239
Characterization of chemically modified silica by infrared and solid state nuclear magnetic resonance spectroscopy K. HegerG. MarxB. Thomas Original paper Pages: 240 - 241
Characterization of SiO2 protective coatings on polycarbonate S. JakobsUlrike SchulzNorbert Kaiser Original paper Pages: 242 - 244
Flow sorption calorimetry, a powerful tool to investigate the acid-base character of organic polymer surfaces S. SchneiderF. SimonH.-J. Jacobasch Original paper Pages: 244 - 247
Chemical analysis of the interface between Al thin films and polymer surfaces pretreated with KrF-excimer laser radiation D. A. WesnerR. WeichenhainE. W. Kreutz Original paper Pages: 248 - 250
Surface analysis of polyethyleneterephthalate by ESCA and TOF-SIMS F.-R. LangY. PittonE. M. Moser Original paper Pages: 251 - 254
Characterisation of pure or coated metal surfaces with streaming potential measurements C. BellmannA. OpfermannH.-J. Adler Original paper Pages: 255 - 258
Characterization of vapor phase deposited organic molecules on silicon surfaces S. DieckhoffR. HöperV. Kempter Original paper Pages: 258 - 262
Characterisation of adsorbed layers on sulphide minerals by photoelectron spectroscopy A. SchaufußP. RoßbachR. Szargan Original paper Pages: 262 - 265
ESCA-Analysis of tin compounds on the surface of hydroxyapatite Karin Schenk-MeuserH. Duschner Original paper Pages: 265 - 267
Investigation of aerosol particles by atomic force microscopy G. KöllenspergerG. FriedbacherL. Dorffner Original paper Pages: 268 - 273
Examination of organosilicon impregnating mixtures by static SIMS and diffuse reflectance FT-IR C. BruchertseiferK. Stoppek-LangnerA. Benninghoven Original paper Pages: 273 - 274
Low energy ion bombardment of Ti and TiNx films C. EggsH. WulffR. Hippler Original paper Pages: 275 - 277
Examination of wear mechanisms of hard coatings T. NiebuhrH. BubertU. Dämgen Original paper Pages: 278 - 280
Scratch test measurement of tribological hard coatings in practice G. BergC. FriedrichC. Berger Original paper Pages: 281 - 285
Density and Young’s modulus of thin TiO2 films O. AndersonC. R. OttermannK. Bange Original paper Pages: 290 - 293
SIMS-analysis on B, N, and C containing layers M. GriesserH. HutterB. Lux Original paper Pages: 293 - 296
On the dynamic range in depth profiling with electron-gas SNMS W. BockM. KopnarskiH. Oechsner Original paper Pages: 300 - 303
Characterization of Laser-Arc deposited multilayer systems by means of AES, Factor Analysis and XPS A. JohnHans-Joachim ScheibeSteffen Oswald Original paper Pages: 304 - 307
Preparation of polycrystalline Ti-Al-O films by magnetron sputtering ion plating: constitution, structure and morphology A. v. RichthofenRainer CremerDieter Neuschütz Original paper Pages: 308 - 311
Preparation of cuprite (Cu2O), paramelaconite (Cu32+Cu21+O4) and tenorite (CuO) with magnetron sputtering ion plating: characterization by EPMA, XRD, HEED and SEM A. v. RichthofenR. DomnickRainer Cremer Original paper Pages: 312 - 315
Density and Young’s modulus of thin TiO2 films O. AndersonC. R. OttermannK. Bange Original paper Pages: 315 - 318
Characterization of interfaces of alumina – high alloyed steels by SST and AES depth profiling A. H. J. van den BergM. A. SmithersV. A. C. Haanappel Original paper Pages: 318 - 322
Characterization of the stoichiometry of coevaporated FeSix films by AES, EDX, RBS, and electron microscopy A. SchöpkeB. SelleM. Powalla Original paper Pages: 322 - 325
Characterization of rhenium-silicon thin films J. ThomasJoachim SchumannWolfram Pitschke Original paper Pages: 325 - 328
Investigation of argon ion bombarded RexSi1-x thin film composites by XPS, SEM and AES R. ReicheS. OswaldK. Wetzig Original paper Pages: 329 - 332
Grazing incidence X-ray diffraction analysis of surface modified SiC layers J. NeuhäuserG. TrefferG. Marx Original paper Pages: 333 - 334
Characterization of crystal faces of polycrystalline HFCVD diamond films by STM/STS R.-J. SchirachB. O. KolbesenF. J. Comes Original paper Pages: 335 - 338
AFM and STM investigations of hydrogenated amorphous silicon: topography and barrier heights J. HerionK. SzotM. Teske Original paper Pages: 338 - 340
Correction of STM tip convolution effects in particle size and distance determination of metal-C:H films K. I. SchiffmannMatthias FrydaPeter Hinze Original paper Pages: 341 - 344
Atomic resolution of defects in graphite studied by STM F. AtamnyA. BaikerR. Schlögl Original paper Pages: 344 - 348
Glass fracture surfaces seen with an atomic force microscope C. WünscheEdda RädleinGünther Heinz Frischat Original paper Pages: 349 - 351
Investigation of surface changes on mica induced by atomic force microscopy imaging under liquids R. ReschG. FriedbacherM. Grasserbauer Original paper Pages: 352 - 355
AES depth profiles of thin SiC-layers – simulation of ion beam induced mixing G. EckeH. RößlerJ. Liday Original paper Pages: 355 - 357
AES Depth profiling of semiconducting multilayer structures using an ion beam bevelling technique M. ProcopA. KleinD. Krüger Original paper Pages: 358 - 360