Quantitative surface analysis by total electron yield Horst EbelNorbert ZaglerRoland Kaitna Lectures Pages: 348 - 350
Quantitative surface analysis by total electron yield Horst EbelNorbert ZaglerRoland Kaitna OriginalPaper Pages: 348 - 350
Quantitative auger electron spectrometric depth profile analysis of binary alloy reference materials R. P. H. GartenH. Bubert Lectures Pages: 351 - 353
Quantitative Auger electron spectrometric depth profile analysis of binary alloy reference materials R. P. H. GartenH. Bubert OriginalPaper Pages: 351 - 353
Relative elemental sensitivity factors in non-resonant laser-SNMS M. WahlD. KochA. Wucher Lectures Pages: 354 - 359
Relative elemental sensitivity factors in non-resonant laser-SNMS M. WahlD. KochA. Wucher OriginalPaper Pages: 354 - 359
HREELS to identify electronic structures of organic thin films D. OeterC. ZieglerW. Göpel Lectures Pages: 360 - 363
HREELS to identify electronic structures of organic thin films D. OeterC. ZieglerW. Göpel OriginalPaper Pages: 360 - 363
Investigation of the surface topography for the characterization of microstructures of amorphous SiNx-coatings W. ZahnW. WuttkeA. Zösch Lectures Pages: 364 - 368
Investigation of the surface topography for the characterization of microstructures of amorphous SiNx-coatings W. ZahnW. WuttkeA. Zösch OriginalPaper Pages: 364 - 368
Applications of SNMS in archaeometry H. PaulusK. -H. MüllerA. Weisgerber OriginalPaper Pages: 369 - 371
Comparative studies of MCs+-SIMS and e–-beam SNMS for quantitative analysis of bulk materials and layered structures U. BreuerH. HolzbrecherH.-J. Dietze OriginalPaper Pages: 372 - 377
Comparative studies of MCs+-SIMS and e−-beam SNMS for quantitative analysis of bulk materials and layered structures U. BreuerH. HolzbrecherH.-J. Dietze Lectures Pages: 372 - 377
High-resolution, low-voltage SEM for true surface imaging and analysis H. JakschJ. P. Martin Lectures Pages: 378 - 382
High-resolution, low-voltage SEM for true surface imaging and analysis H. JakschJ. P. Martin OriginalPaper Pages: 378 - 382
Characterization of ultra smooth interfaces in Mo/Si-multilayers R. DietschTh. HolzH. Wendrock Lectures Pages: 383 - 388
Characterization of ultra smooth interfaces in Mo/Si-multilayers R. DietschTh. HolzH. Wendrock OriginalPaper Pages: 383 - 388
Performance and limitations of electron probe microanalysis applied to the characterization of coatings and layered structures P. WillichR. Bethke Lectures Pages: 389 - 392
Performance and limitations of electron probe microanalysis applied to the characterization of coatings and layered structures P. WillichR. Bethke OriginalPaper Pages: 389 - 392
EPMA of interfaces applied to the solid oxide fuel cell H. GrübmeierA. NaoumidisA. Tsoga Lectures Pages: 393 - 398
EPMA of interfaces applied to the solid oxide fuel cell H. GrübmeierA. NaoumidisA. Tsoga OriginalPaper Pages: 393 - 398
Combined NRA, channeling-RBS and FTIR ellipsometry analyses for the determination of the interface and bonding state of thin SiOx and SiNxOy layers R. W. MichelmannH. BaumannK. Bethge Lectures Pages: 403 - 407
Combined NRA, channeling-RBS and FTIR ellipsometry analyses for the determination of the interface and bonding state of thin SiOx and SiNxOy layers R. W. MichelmannH. BaumannK. Bethge OriginalPaper Pages: 403 - 407
Temperature-induced changes in the composition of floatglass surfaces M. LaubeF. Rauch Lectures Pages: 408 - 412
Temperature-induced changes in the composition of floatglass surfaces M. LaubeF. Rauch OriginalPaper Pages: 408 - 412
Atomic force microscopy of coated glasses E. RädleinR. AmbosG. H. Frischat OriginalPaper Pages: 413 - 418
Prepolymer film growth by adsorption out of solution on silicon and aluminium T. GesangR. HöperO.-D. Hennemann Lectures Pages: 419 - 426
Prepolymer film growth by adsorption out of solution on silicon and aluminium T. GesangR. HöperO. -D. Hennemann OriginalPaper Pages: 419 - 426
Surface structure and roughness of Nickel-Titanium wires Th. FriesC. BourauelR. Plietsch Lectures Pages: 427 - 432
Surface structure and roughness of Nickel-Titanium wires Th. FriesC. BourauelR. Plietsch OriginalPaper Pages: 427 - 432
AFM and XRD investigation of crystalline vapor-deposited C60 films F. AtamnyA. BaikerR. Nesper Lectures Pages: 433 - 438
AFM and XRD investigation of crystalline vapor-deposited C60 films F. AtamnyA. BaikerR. Nesper OriginalPaper Pages: 433 - 438
Deconvolution of STM images using entropy as a regularization functional S. D. BöhmigM. SchmidH. Störi Postersession Pages: 439 - 442
Deconvolution of STM images using entropy as a regularization functional S. D. BöhmigM. SchmidH. Störi OriginalPaper Pages: 439 - 442
Data management in multi-method surface analysis K. W. BrandlS. D. BöhmigH. Störi Postersession Pages: 443 - 446
Data management in multi-method surface analysis K. W. BrandlS. D. BöhmigH. Störi OriginalPaper Pages: 443 - 446
Simulation of sputter-induced roughness for depth profiling of thin film structures T. WöhnerG. EckeS. Hofmann Postersession Pages: 447 - 449
Simulation of sputter-induced roughness for depth profiling of thin film structures T. WöhnerG. EckeS. Hofmann OriginalPaper Pages: 447 - 449
A fast and simple method for background removal in Auger electron spectroscopy H. E. Bauer Postersession Pages: 450 - 455
A fast and simple method for background removal in Auger electron spectroscopy H. E. Bauer OriginalPaper Pages: 450 - 455
Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES H. BubertE. GrallathL. Borucki Postersession Pages: 456 - 463
Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES H. BubertE. GrallathL. Borucki OriginalPaper Pages: 456 - 463
Examples for the improvements in AES depth profiling of multilayer thin film systems by application of factor analysis data evaluation U. Scheithauer Postersession Pages: 464 - 467
Examples for the improvements in AES depth profiling of multilayer thin film systems by application of factor analysis data evaluation U. Scheithauer OriginalPaper Pages: 464 - 467
Surface and in-depth characterization of TiC/C and Ti(C,N) layers by means of AES and Factor analysis A. John Postersession Pages: 468 - 472
Surface and in-depth characterization of TiC/C and Ti(C,N) layers by means of AES and Factor Analysis A. John OriginalPaper Pages: 468 - 472