XPS and AES analysis of passive films on Fe-25Cr-X (X = Mo, V, Si and Nb) model alloys C. HubschmidD. LandoltH. J. Mathieu OriginalPaper Pages: 234 - 239
XPS and AES analysis of passive films on Fe-25Cr-X (X = Mo, V, Si and Nb) model alloys C. HubschmidD. LandoltH. J. Mathieu Lectures Pages: 234 - 239
Investigation of the thermal stability of Ni/C multilayers by X-ray methods R. KrawietzB. WehnerW. Pompe Lectures Pages: 246 - 250
Investigation of the thermal stability of Ni/C multilayers by X-ray methods R. KrawietzB. WehnerW. Pompe OriginalPaper Pages: 246 - 250
Position sensitive atom probe study of segregation in molybdenum alloys M. Leisch Lectures Pages: 251 - 253
Position sensitive atom probe study of segregation in molybdenum alloys M. Leisch OriginalPaper Pages: 251 - 253
Surface cosegregation on Fe-3% V-C, Fe-3% V-C,N and Fe-15% Cr-N (110) single crystals C. UebingH. ViefhausH. J. Grabke Lectures Pages: 254 - 258
Surface cosegregation on Fe-3%V-C, Fe-3%V-C,N and Fe-15%Cr-N (110) single crystals C. UebingH. ViefhausH. J. Grabke OriginalPaper Pages: 254 - 258
Competitive segregation of Si and P on Fe96.5Si3.5 (100) and (110) A. BiedermannM. SchmidP. Varga Lectures Pages: 259 - 262
Competitive segregation of Si and P on Fe96.5Si3.5 (100) and (110) A. BiedermannM. SchmidP. Varga OriginalPaper Pages: 259 - 262
Characterization of the chemical bonding in inner layers of composite materials R. SchneiderJ. WoltersdorfA. Röder Lectures Pages: 263 - 266
Characterization of the chemical bonding in inner layers of composite materials R. SchneiderJ. WoltersdorfA. Röder OriginalPaper Pages: 263 - 266
Determination of lattice and grain boundary diffusion coefficients in protective alumina scales on high temperature alloys using SEM, TEM and SIMS D. ClemensK. BongartzJ.-S. Becker Lectures Pages: 267 - 270
Determination of lattice and grain boundary diffusion coefficients in protective alumina scales on high temperature alloys using SEM, TEM and SIMS D. ClemensK. BongartzJ. -S. Becker OriginalPaper Pages: 267 - 270
Characterization of Cu-Sn/Pb diffusion zones of microelectronic contacts by means of electron probe microanalysis and ion beam sputtering Siegfried DäbritzWolfgang Hauffe Lectures Pages: 271 - 277
Characterization of Cu-Sn/Pb diffusion zones of microelectronic contacts by means of electron probe microanalysis and ion beam sputtering Siegfried DäbritzWolfgang Hauffe OriginalPaper Pages: 271 - 277
XPS studies of thin polycyanurate films on silicon wafers S. DieckhoffV. SchlettO.-D. Hennemann Lectures Pages: 278 - 281
XPS studies of thin polycyanurate films on silicon wafers S. DieckhoffV. SchlettO. -D. Hennemann OriginalPaper Pages: 278 - 281
Low energy ion implantation in polybithiophene: microstructuring and microanalysis K. G. JungJ. W. SchultzeH. Schmiedel Lectures Pages: 282 - 289
Low energy ion implantation in polybithiophene: microstructuring and microanalysis K. G. JungJ. W. SchultzeH. Schmiedel OriginalPaper Pages: 282 - 289
Development and characterization of a wettable surface modified aromatic polyethersulphone using glow discharge induced HEMA-graft polymerisation H. ThelenR. KaufmannH. Höcker Lectures Pages: 290 - 296
Development and characterization of a wettable surface modified aromatic polyethersulphone using glow discharge induced HEMA-graft polymerisation H. ThelenR. KaufmannH. Höcker OriginalPaper Pages: 290 - 296
External proton beam analysis of layered objects W. WagnerC. Neelmeijer OriginalPaper Pages: 297 - 302
Scanning kelvin microscope: a new method for surface investigations J. RenH.-D. LießH. Baumgärtner Lectures Pages: 303 - 306
Scanning Kelvin Microscope: a new method for surface investigations J. RenH. -D. LießH. Baumgärtner OriginalPaper Pages: 303 - 306
Interpretation of sputter depth profiles by mixing simulations G. KuprisH. RößlerS. Hofmann Lectures Pages: 307 - 310
Interpretation of sputter depth profiles by mixing simulations G. KuprisH. RößlerS. Hofmann OriginalPaper Pages: 307 - 310
High resolution depth profile analysis by elastic recoil detection with heavy ions G. DollingerA. BergmaierC. M. Frey Lectures Pages: 311 - 315
High resolution depth profile analysis by elastic recoil detection with heavy ions G. DollingerA. BergmaierC. M. Frey OriginalPaper Pages: 311 - 315
Electroreduction of oxygen on octadecylmercaptan self-assembled monolayers E. R. VagoK. de WeldigeM. Stratmann Lectures Pages: 316 - 319
Electroreduction of oxygen on octadecylmercaptan self-assembled monolayers E. R. VagoK. de WeldigeM. Stratmann OriginalPaper Pages: 316 - 319
Quantitative aspects of the desorption of copper from the silicon (100) surface U. GöbelF. AtamnyR. Schlögl Lectures Pages: 320 - 323
Quantitative aspects of the desorption of copper from the silicon (100) surface U. GöbelF. AtamnyR. Schlögl OriginalPaper Pages: 320 - 323
Analysis of solids with a secondary-neutral microprobe based on electron-gas post-ionization W. BieckH. GnaserH. Oechsner Lectures Pages: 324 - 328
Analysis of solids with a secondary-neutral microprobe based on electron-gas post-ionization W. BieckH. GnaserH. Oechsner OriginalPaper Pages: 324 - 328
Adsorption of self-assembled monolayers of mercaptan on gold K. de WeldigeM. RohwerderM. Stratmann Lectures Pages: 329 - 332
Adsorption of self-assembled monolayers of mercaptan on gold K. de WeldigeM. RohwerderM. Stratmann OriginalPaper Pages: 329 - 332
Investigation of the delamination of polymer films from galvanized steel with the Scanning Kelvinprobe W. FürbethM. Stratmann Lectures Pages: 337 - 341
Investigation of the delamination of polymer films from galvanized steel with the Scanning Kelvinprobe W. FürbethM. Stratmann OriginalPaper Pages: 337 - 341
Titanium distributions in zone melted materials measured by SIMS S. OswaldB. BeyerJ. Kunze Lectures Pages: 342 - 347
Titanium distributions in zone melted materials measured by SIMS S. OswaldB. BeyerJ. Kunze OriginalPaper Pages: 342 - 347
