A simple method for local resolved electrochemical surface characterisation W.-D. MüllerK. Ibendorf Short Communications Pages: 182 - 184
SIMS-characterization of ultra shallow boron-profiles after BF 2 + -and B+-low-energy-implantation in silicon O. KretzerG. LenkU. Gunst Short Communications Pages: 184 - 186
Maximum entropy deconvolution of secondary ion mass spectra with a measured response M. RitterH. HutterM. Grasserbauer Short Communications Pages: 186 - 190
In-situ investigation of surface reactions on alkali halides by atomic force microscopy T. ProhaskaG. FriedbacherM. Grasserbauer Short Communications Pages: 190 - 194
Model calculations of interface segregation in dilute systems M. M. EislB. M. ReichlH. Störi Short Communications Pages: 194 - 196
Investigation of the segregation on a Fe-3.5at% Si bicrystal with AES and SAM B. M. ReichlM. M. EislH. Störi Short Communications Pages: 196 - 197
Automatic matching of SAM, SIMS and EPMA images S. D. BöhmigB. M. ReichH. Hutter Short Communications Pages: 197 - 199
Surface segregation of Pt10Ni90(110): experimental and theoretical results P. WeigandB. JelinekP. Varga Short Communications Pages: 199 - 201
Chemical analysis of PtxNi1−x alloy single crystal surfaces by scanning tunnelling microscopy A. BiedermannM. SchmidP. Varga Short Communications Pages: 201 - 203
Calibration of depth profiles of microparticles measured with plasma-based secondary neutral mass spectrometry J. GoschnickJ. SchurichtH. J. Ache Short Communications Pages: 203 - 205
Depth-resolved speciation of nitrogen compounds in environmental solids J. W. G. BentzM. FichtnerH.-J. Ache Short Communications Pages: 205 - 207
Measurement of isotope ratios in solids by glow discharge mass spectrometry K. H. EckerW. Pritzkow Short Communications Pages: 207 - 208
Calibration standards for composition-depth profiles of non-stoichiometric titanium nitride coatings H.-R. StockF. HöhlP. Mayr Short Communications Pages: 208 - 209
Depth profiling of frictional brass coated steel samples by glow discharge mass spectrometry U. BehnF. A. GerbigH. Albrecht Short Communications Pages: 209 - 210
Effects of a controlled N2 and O2 addition to Ar on the analytical parameters of the GD-OES W. FischerA. NaoumidisH. Nickel Short Communications Pages: 210 - 213
Description of sputter removal during auger depth profiling of rough oxide layers S. BaunackR. BarchmannR. Winkler Short Communications Pages: 214 - 215
Analytics of hard amorphous silicon containing PECVD-coatings R. HeynerS. MännelG. Marx Short Communications Pages: 215 - 216
Characterization of oxide scales on coatings for gas turbine blades by infrared reflection-absorption spectroscopy Th. ScherüblL. K. Thomas Short Communications Pages: 216 - 219
Chemical modification of silica surfaces A. ReuterK. HegerG. Marx Short Communications Pages: 219 - 221
TOF-SIMS and FT-IR investigations of surface modified silicon wafers — porous silicon R. DietrichJ. GrobeA. Benninghoven Short Communications Pages: 221 - 222
Investigation of the insertion of water in hydrated layers of silicate electrode glasses K. HerzogK. ScholzB. Thomas Short Communications Pages: 223 - 224
Solid state analysis in mechanochemistry by high resolution 27Al solid state NMR spectroscopy Werner StorekHendrik KosslickHans-Peter Hennig Short Communications Pages: 225 - 227
Determination of debye temperatures of supported ion particles by mössbauer spectroscopy C. MohrS. BieberK. Nagorny Short Communications Pages: 227 - 228
Thiocyanate bond mode determination on solid manganese(II) mixed ligand coordination compounds H. BöhlandG. KönigH. Umbreit Short Communications Pages: 228 - 230
XAS and XRD studies of rhenium-oxygen compounds G. WltschekM. FröbaW. Metz Short Communications Pages: 230 - 231
Neutron and X-ray investigations on the oxygen bonding in YBa2Cu3O7-x combined with physico-chemical methods M. GroßeG. SchusterK. Henkel Short Communications Pages: 231 - 233
ARXPS-analysis and morphology of sputtered nanocrystalline TiC/SiC coatings B. HornetzH.-J. MichelJ. Halbritter Short Communications Pages: 233 - 235
Investigation of the rubber-metal bonding system by means of analytical electron microscopy and comparison with results of technical tear strength measurements T. KretzschmarK. HummelG. Grubbauer Short Communications Pages: 235 - 236
Complex solid state physical investigations of metal layers on plastics D. MannA. EickeL. Spieß Short Communications Pages: 237 - 237
TEM-cross section investigations of plasma polymer silver composite films W. GrünewaldA. HeilmannF. Homilius Short Communications Pages: 238 - 239
Cross-section TEM for examinations of selective tungsten CVD for via hole filling W. GrünewaldS. E. Schulz Short Communications Pages: 239 - 240
Investigations of thin hydrogenated amorphous carbon films using electron energy loss spectroscopy (EELS) U. Falke Short Communications Pages: 241 - 241
Electron probe microanalysis of chemical gradients in gas pressure sintered silicon nitride E. BischoffU. NeidhardtH. Schubert Short Communications Pages: 242 - 243
The microstructure of high-strength mortars and concretes Katrin RübnerCarsten Schmidt Short Communications Pages: 243 - 245
Determination of the optimum Eu3+-concentration in LaAlO3:Euphosphors by X-ray diffraction and fluorescence measurements J. KlimkeH. Wulff Short Communications Pages: 245 - 246
High temperature X-ray diffraction studies of the crystallization process of thin amorphous films with the chemical composition CrSi2.57 W. PitschkeM. KochJ. Schumann Short Communications Pages: 246 - 247
On the crystal structure of heterogeneous catalysts at reaction-conditions: “in-situ” X-ray powder diffraction B. HerzogT. IlkenhansR. Schlögl Short Communications Pages: 247 - 249
TEM investigations on PECVD-titanium carbide layers Birgit ArnoldIngolf Endler Short Communications Pages: 249 - 251
Decomposition applying elemental fluorine for the analysis of element traces in fine ceramics U. RichtsR. P. H. GartenG. Tölg Short Communications Pages: 251 - 253
Reactive diffusion in Pd/Ni/CuSn6 layer systems at 500°C M. LorenzD. BergnerH. Baum Short Communications Pages: 253 - 254
UV and IR derivative spectroscopy of novolac layers M. ReinhardtH.-J. Lorkowski Short Communications Pages: 254 - 255
Investigations of the thermal degradation of polymer metal precursors for high temperature superconducting ceramics I. v LampeM. WäscheH.-J. Lorkowski Short Communications Pages: 256 - 257
Classification of electrode glasses including structural parameters K. ScholzE. HennebergB. Thomas Short Communications Pages: 257 - 258