Microanalysis of solid surfaces by Secondary Neutral Mass Spectrometry A. Wucher Main Lectures Pages: 3 - 10
Investigations on thin solid layers by analytical transmission electron microscopy Hans-Dietrich Bauer Main Lectures Pages: 11 - 13
Characterization of multilayer-interfaces by X-ray diffraction, TEM, SNMS and AES S. HopfeN. KallisP. Weißbrot Short Lectures Pages: 14 - 22
Photoelectron spectroscopic and ellipsometric investigation of In0.53Ga0.47As surfaces after wet chemical etching M. ProcopK. Wandel Short Lectures Pages: 23 - 28
Auger microprobe-surface analysis of sub-μm nitrides and carbonitrides in steel H. HantscheD. SchmidtT. Wirth Short Lectures Pages: 29 - 36
Analytical characterization of coated carbon fibres Eberhard ThanAndreas HofmannGunter Leonhardt Short Lectures Pages: 37 - 40
Deposition and characterization of thin boron-carbide coatings H. KünzliP. GantenbeinP. Oelhafen Short Lectures Pages: 41 - 44
Characterization of surface coatings by the scratch adhesion test and by indentation measurements H. E. Hintermann Short Lectures Pages: 45 - 52
Effects of growth conditions on the surface structure of CdTe studied by a scanning tunneling microscope M. WenzelM. EhingerG. Landwehr Short Lectures Pages: 53 - 57
Atomic Force Microscopy of technological and biological samples Gernot FriedbacherManfred Grasserbauer Short Lectures Pages: 58 - 60
ESCA-Imaging used for problem solving in the chemical industry H. PulmW. D. Herberg Short Lectures Pages: 61 - 65
Topochemical characterization of materials using 3D-SIMS Herbert HutterPeter WilhartitzManfred Grasserbauer Short Lectures Pages: 66 - 68
AES and LEED studies of the initial stages of oxidation of β-NiAl with and without platinum doping H. ViefhausJ. P. RouxH. J. Grabke Short Lectures Pages: 69 - 74
Surface analytical investigations on the oxidation behaviour of TiAl-base intermetallics U. FiggeA. ElschnerW. J. Quadakkers Short Lectures Pages: 75 - 78
On the characterization of surface VOx-species by XPS: layered oxidic systems as model catalysts J. NicklCh. SchildA. Wokaun Short Lectures Pages: 79 - 83
XPS characterization of the reduction and synthesis behaviour of Co/Mn oxide catalysts for Fischer-Tropsch synthesis K. GuseH. Papp Short Lectures Pages: 84 - 91
SIMS depth profile analysis for investigations of the lithium-diffusion in hydrogenated amorphous silicon U. ZastrowW. BeyerJ. Herion Short Lectures Pages: 92 - 95
XPS- and AES-investigations of electron and ion beam induced effects on SK16 glass surfaces U. RothhaarV. RupertusH. Oechsner Short Lectures Pages: 96 - 98
Infrared reflection studies of ceramics: characterization of SiC layers on graphite substrates V. HopfeW. GrählertW. Theiß Short Lectures Pages: 99 - 103
Charge compensation for XPS on polymers A. P. PijpersK. BerresheimM. Wilmers Short Lectures Pages: 104 - 109
Phase composition of Fe-containing Langmuir-Blodgett layers after thermal treatment in a reactive atmosphere W. MeiselT. FaldumP. Gütlich Short Lectures Pages: 110 - 113
Micro spectroscopy FTIR reflectance examination of paint binders on ground chalk H. SchulzB. Kropp Short Lectures Pages: 114 - 122
Depth-profiling of organic layers on microparticles with SNMS J. W. G. BentzH. -P. EwingerH. J. Ache Short Lectures Pages: 123 - 127
Structural study of potential controlled deposited Langmuir-Blodgett-films on metal substrates R. LöschM. StratmannH. Viefhaus Short Lectures Pages: 128 - 130
Round robin study of the INA-3 users forum: technical Al and steel samples J. BartellaR. FuchsD. Grunenberg Short Lectures Pages: 131 - 133
Trace analysis of ceramic surfaces by laser ionization mass spectrometry J. S. BeckerH. -J. Dietze Short Lectures Pages: 134 - 137
Surface analysis of steel sheets with GDOS and EPMA J. AngeliK. HaselgrüblerH. Burger Short Lectures Pages: 138 - 143
Quantification of the GD-OES in-depth analysis: one way for its realization — its capabilities and limitations W. FischerA. NaoumidisH. Nickel Short Lectures Pages: 144 - 146
Examinations regarding the correctness of quantitative surface analysis using SNMS D. GrunenbergD. SommerK. H. Koch Short Lectures Pages: 147 - 150
Determination of hydrogen depth profiles in polymer films by the 15N nuclear reaction technique K. -H. GießlerD. EndischM. Stamm Short Lectures Pages: 151 - 154
Surface analysis by means of reflection, fluorescence and diffuse scattering of hard X-ray B. LengelerM. Hüppauff Short Lectures Pages: 155 - 161
Optimization of thin-layer methods in the energy dispersive fluorescence X-ray spectroscopy of inorganic atmospheric pollutants M. MathernyV. Balgavá Short Lectures Pages: 162 - 164
Application of glow discharge optical emission spectroscopy (GDOES) to the analysis of PVD- and CVD-layers Volker Hoffmann Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 165 - 168
SNMS and XRD investigations of laser deposited YSZ buffer layers M. LorenzH. BörnerH. Hochmuth Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 169 - 172
Investigation of thin fluoride films for optical applications by surface analytical methods and electron microscopy D. MademannL. RaupachN. Kaiser Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 173 - 176
Characterisation of thin sputtered silicon nitride films by NRA, ERDA, RBS and SEM A. MarkwitzH. BaumannP. Misaelides Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 177 - 180
Production and characterization of C and SiC layers on C fibres G. MarxP. W. MartinK. Nestler Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 181 - 185
Quantitative analysis of oxide films on ODS-alloys using MCs+-SIMS and e-beam SNMS J. -P. PfeiferH. HolzbrecherW. Speier Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 186 - 191
Composition of Ti-N films: EDX analysis during the sputtering process T. StobieckiF. StobieckiK. Röll Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 192 - 195
Noise suppression in scanning Auger Images — comparison of various digital filters S. D. BöhmigH. BeilschmidtB. M. Reichl Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 196 - 199
Practical polymer film characterisation using high performance XPS methods I. W. DrummondK. S. RobinsonH. Schmiedel Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 200 - 204
Development of a measuring set-up for high-sensitivity analysis of hydrogen by the 15N nuclear reaction technique D. EndischH. SturmF. Rauch Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 205 - 207
Compact data processing and control system for SIMS and AES W. HilgersJ. HerionU. Zastrow Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 208 - 210
Scanning XPS; low kinetic energy source scanning: some design considerations I. R. Holton Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 211 - 213
Crater formation in oxidic materials generated by using ion- and laser beams S. PriggemeyerJ. H. ArpsW. Heiland Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 214 - 217
The use of parallel imaging ESCA to analyse features smaller than 5 microns N. M. ForsythP. Coxon Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 218 - 222
Segmentation and scatter diagram analysis of scanning Auger images — A critical comparison of results S. D. BöhmigB. M. Reichl Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 223 - 226
ARXPS-analysis of sputtered TiC, SiC and Ti0.5Si0.5C layers V. SchierH. -J. MichelJ. Halbritter Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 227 - 232
Some aspects of the charging effect in monochromatized focused XPS X. YuH. Hantsche Poster Session A: Connected Layers, Development Of Processes And Microanalytical Methods Pages: 233 - 236
