Surface analysis and surface measuring techniques in firearm offences H. W. WenzW. J. LichtenbergH. Katterwe Part II Pages: 155 - 165
Raman-microanalysis of strain and crystal orientation in laser-crystallized silicon G. KolbTh. SalbertG. Abstreiter Part II Pages: 166 - 170
Peculiarities of AES-depth profiling results from multilayered X-ray monochromators J. KlosowskiH. MaiS. Völlmar Part II Pages: 171 - 175
Growth and characterization of Si/Sb superlattices H. JorkeH. -J. HerzogH. Kibbel Part II Pages: 176 - 179
Application of the two-dimensional lateral microanalysis by SIMS and EPMA in materials research S. OswaldL. SiegertG. Große Part II Pages: 180 - 183
Scanning tunneling microscopy of lead selenide monocrystals and epitaxial layers on barium fluoride W. StockerS. N. MagonovM. Tacke Part II Pages: 184 - 188
A fully computerized modular scanning tunneling microscope system Th. FriesC. BeckerK. Wandelt Part II Pages: 193 - 195
Characterization of tungsten tips for STM by SEM/AES/XPS W. LisowskiA. H. J. van den BergL. J. Hanekamp Part II Pages: 196 - 199
AES and XPS investigations for the topochemical characterization of dope elements on WC powders A. BaalmannV. Schlett Part II Pages: 200 - 206
Detection of particulate polycyclic aromatic hydrocarbons by laser-induced time-resolved fluorescence Reinhard NiessnerWilfried RobersAndreas Krupp Part II Pages: 207 - 213
SIMS for hydrogen quantification and structural analysis of amorphous silicon germanium compounds A. EickeG. Bilger Part II Pages: 214 - 218
SIMS and AES measurements on the LaNi5-hydrogen system H. ZüchnerR. DobrileitT. Rauf Part II Pages: 219 - 223
The application of surface analytical techniques to silicon technology M. G. Dowsett Part II Pages: 224 - 234
Surface analysis of functional layers for semiconductor production A. NaoumidisK. Brennfleck Part II Pages: 235 - 240
Approaches for quantitative Auger electron spectroscopy of silicon after high dose nickel implantation A. SchönbornH. BubertE. H. te Kaat Part II Pages: 241 - 244
Dose determination of nickel implantations in silicon wafers H. BubertP. BurbaM. Wielunski Part II Pages: 245 - 247
Studies of GaAs surface roughness and organic masks resistance depending on the ion-beam energy B. WalkowH. W. LoebC. Mößner Part II Pages: 248 - 250
Measurement of the electric potential in silicon solar cells employing an electron-beam tester H. SchmoranzerA. MayerA. Jank Part II Pages: 251 - 254
Charge effects during surface analysis of poorly conducting inorganic materials G. BorchardtS. ScherrerS. Weber Part II Pages: 255 - 259
Comparative bulk, surface and depth profile analyses on AlN and SiC-coated B4C powders H. JenettE. GrallathP. Kennis Part II Pages: 265 - 271
Novel optical techniques for the analysis of polymer surfaces and thin films W. KnollW. HickelH. Knobloch Part II Pages: 272 - 278
Observation of spectral interferences for the determination of volume and surface effects of thin films G. GauglitzW. Nahm Part II Pages: 279 - 283
X-ray and neutron reflectometry for the investigation of polymer diffusion G. ReiterS. HüttenbachM. Stamm Part II Pages: 284 - 288
CEMS/XPS study of iron stearate Langmuir-Blodgett layers W. MeiselP. Tippmann-KrayerP. Gütlich Part II Pages: 289 - 291
Stoichiometric and structural analyses of thin high-Tc superconducting Bi-Sr-Ca-Cu-O films on silicon M. LorenzH. -K. BotheH. -J. Dietze Part II Pages: 292 - 295
Photoemission studies of BaPb1−xBixO3 and Ba1−yKyBiO3 crystals A. WiniarskiG. WübbelerM. Neumann Part II Pages: 296 - 300
Characterization of sputter-deposited YBaCuO films by X-ray photoelectron spectroscopy H. BehnerG. GieresB. Sipos Part II Pages: 301 - 307
Interface analysis of the system Si/YBa2Cu3O7−x C. ZieglerF. BaudenbacherW. Göpel Part II Pages: 308 - 313