Quantitative XPS-analysis of tantalum-containing amorphous carbon films M. GrischkeA. BrauerP. Willich OriginalPaper Pages: 299 - 303
Investigations on zirconium-containing conversion layers on aluminium H. HubertH. PuderbachW. A. Roland OriginalPaper Pages: 304 - 307
Multidimensional image acquisition and processing in surface analysis F. G. Rüdenauer OriginalPaper Pages: 308 - 311
Scanning tunneling microscopy — a new method in surface analysis K. Besocke OriginalPaper Pages: 312 - 312
Measurement of the Young's modulus for structural characterization of amorphous Si:C:N:H-films K. W. GerstenbergK. Taube OriginalPaper Pages: 313 - 314
On sample topography and its influence on the spatial resolution of Scanning Auger Microscopy Wolfgang Hösler OriginalPaper Pages: 315 - 317
Quantitative Auger depth profiling of LPCVD and PECVD silicon nitride films Enrico G. KeimKamal Aïte OriginalPaper Pages: 319 - 321
Ion fractions of matrix elements and impurities in GaAs bombarded by O 2 + primary ions K. Miethe OriginalPaper Pages: 322 - 325
Hydrogen profile analysis in a-C:H films by elastic recoil detection (ERD) K. SchmidtK. ReicheltJ. Zou OriginalPaper Pages: 326 - 328
Chemical and matrix effects in Auger electron spectroscopy H. Viefhaus OriginalPaper Pages: 329 - 330
Quantification of Auger depth profiles by means of Rutherford backscattering spectrometry Hubert de RugyPhilippe SaliotRoland Pantel OriginalPaper Pages: 331 - 332
Three-dimensional analysis of trace elements with the CAMECA IMS 4F H. N. MigeonM. SchuhmacherB. Rasser OriginalPaper Pages: 333 - 334
High lateral resolution and very high sensitivity in XPS with excitation by synchrotron radiation M. SchaibleW. BraunE. -E. Koch OriginalPaper Pages: 335 - 336
Fast scanning tunneling microscope in constant current mode S. BräuerB. KrämerW. Wirth OriginalPaper Pages: 340 - 342
Quantitative depth profile analysis of high-Tc-superconductors with sputtered neutral mass spectrometry (SNMS) H. PetersL. SkodaH. Adrian OriginalPaper Pages: 343 - 345
Acoustic microscopy and XPS-analysis of the polymer/metal-interface of adhesive joints and coatings J. v. CzarneckiA. MüllerO. Rist OriginalPaper Pages: 346 - 349
Study of transient thermal surface processes J. FischerQ. KongF. Träger OriginalPaper Pages: 350 - 352
Surface and depth-profile analysis using FTIR spectroscopy Joachim Oelichmann OriginalPaper Pages: 353 - 359
Problems with the analysis of glass and glass ceramic surfaces and coatings Hans Bach OriginalPaper Pages: 373 - 382
Self-diffusion in Mg2SiO4 (forsterite) at high temperature K. AnderssonG. BorchardtS. Weber OriginalPaper Pages: 383 - 385
Surface analytical investigations of leached potash-lime-silica glass M. SchreinerK. PiplitsM. Grasserbauer OriginalPaper Pages: 386 - 387
Microanalytical investigation of fibre-reinforced ceramic materials B. MeierG. Grathwohl OriginalPaper Pages: 388 - 393
Quantitative analysis of the structure in the fracture zone of silicon carbide A. BrandstädterK. KoizlikE. Wallura OriginalPaper Pages: 394 - 397
XPS and AES investigations of the reaction behaviour of iodine with Zircaloy-4 surfaces R. KaufmannH. Klewe-NebeniusH. J. Ache OriginalPaper Pages: 398 - 400
Water of crystallization and its hydrogen-bonded crosslinking in vivianite Fe3(PO4)2 · 8H2O; a neutron diffraction investigation H. Bartl OriginalPaper Pages: 401 - 403
Scanning Auger investigation of sulphur and carbon segregation on a steel surface A. TschulikA. RiahiH. Störi OriginalPaper Pages: 404 - 405
Corrosion behaviour of the steel 1.4361 studied by combined XPS, electrochemistry and radionuclide techniques M. Maar-StummM. BrunsH. J. Ache OriginalPaper Pages: 406 - 407
Quantitative depth profiling with AES: application to oxide layers of NiCrFe alloys J. SteffenS. Hofmann OriginalPaper Pages: 408 - 409
Ellipsometrical measurements on porous copper films R. SchmidtP. Wißmann OriginalPaper Pages: 410 - 412
SIMS investigations of wall coatings for application in nuclear fusion reactors G. FriedbacherA. ViragP. Wienhold OriginalPaper Pages: 413 - 416
Embrittlement of tungsten heavy alloys by trace impurities and their analytical characterization H. DanningerA. AtariA. Tschulik OriginalPaper Pages: 417 - 421
A study of photographic paper by secondary-ion-mass-spectrometry J. SalerT. BremerH. Koschmieder OriginalPaper Pages: 426 - 427
Surface area, density and porosity measurements using the magnetic suspension balance E. RobensT. GastU. Müller OriginalPaper Pages: 428 - 432
High-resolution sorption studies of argon and nitrogen on large crystals of microporous zeolite ZSM-5 U. MüllerH. ReichertA. Mersmann OriginalPaper Pages: 433 - 436
Investigations on the surface properties of ultrafine aerosols by means of a multistep condensation nuclei counter Reinhard NiessnerBernd DäumerDieter Klockow OriginalPaper Pages: 437 - 438
Determination of the sorption- and desorption-properties from PAH-coated ultrafine particles with the photoelectric aerosol sensor R. NiessnerP. Wilbring OriginalPaper Pages: 439 - 440
Quantitative analysis of steel sheet surfaces using computer-aided electron probe microanalysis S. BaumgartlP. Busch OriginalPaper Pages: 441 - 446
Quantification of SNMS investigations of coated materials K. H. KochD. SommerD. Grunenberg OriginalPaper Pages: 447 - 450
Small area MXPS- and TEM-measurements on temper-embrittled 12% Cr steel H. GoretzkiP. v. RosenstielS. Mandziej OriginalPaper Pages: 451 - 452
Determination of the surface segregation of alloys P. NovacekA. LieglP. Varga OriginalPaper Pages: 453 - 455
Wear mechanisms of ultra-hard non-metallic cutting materials W. KoenigA. Boemcke OriginalPaper Pages: 461 - 465
Depth profiles of Ta2O5/SiO2/Si structures: a combined X-ray photoemission, Auger electron, and secondary ion mass spectroscopic study P. GimmelB. GompfW. Göpel OriginalPaper Pages: 466 - 469