1. ToF-SIMS and XPS investigations of fibers, coatings and biomedical materials

   • P. J. de Lange
   • J. W. G. Mahy

   Lectures Pages: 487 - 493

2. Microscopy and microspectroscopy with soft X-rays

   • C. Kunz
   • J. Voss

   Lectures Pages: 494 - 498

3. Applications of work function microscopy in the onset mode

   • Jörg Scholtes

   Lectures Pages: 499 - 505

4. Interfacial reactions in chromium-carbon multilayers

   • J. Scherer
   • K. Jung
   • H. Ehrhardt

   Lectures Pages: 506 - 509

5. High resolution depth profiling of non-conducting samples with SNMS

   • W. Bock
   • M. Kopnarski
   • H. Oechsner

   Lectures Pages: 510 - 513

6. “HFM”, the universal sputter method in SNMS analytics

   • D. Grunenberg
   • D. Sommer
   • K. H. Koch

   Lectures Pages: 514 - 520

7. Induced zinc desorption from zinc oxide during exposure to a reducing agent

   • Ch. Krummel
   • A. Freiling
   • C. D. Kohl

   Lectures Pages: 521 - 523

8. 3D-SIMS analysis of ultra high purity molybdenum and tungsten: a characterisation of different manufacturing techniques and products

   • Peter Wilhartitz
   • R. Krismer
   • H. M. Ortner

   Lectures Pages: 524 - 532

9. Determination of diffusion induced concentration profiles in Cr₂O₃ films on ceramic Al₂O₃ by Auger sputter depth profiling

   • U. Rothhaar
   • H. Oechsner

   Lectures Pages: 533 - 535

10. RFA as control method of the reactive sputtering process of TiN films

    • T. Stobiecki
    • F. Stobiecki
    • G. Berg

    Lectures Pages: 536 - 540

11. Surface analysis on industrial surfaces — now comparable

    • D. Sommer
    • H. P. Dickhoven

    Lectures Pages: 541 - 543

12. AES investigations of the hot cracking of an electron-beam welded nickel-base alloy for turbine disks

    • V. Schlett
    • W.-B. Busch

    Lectures Pages: 544 - 547

13. Accuracy of the elemental quantification with plasma-based SNMS for complex environmental material

    • J. Goschnick
    • M. Sommer
    • H. J. Ache

    Lectures Pages: 548 - 551

14. Characterization of surface modifications of stainless steel samples after electron and ion bombardment by SEM, AES, and XPS

    • B. Garke
    • M. Ehrt
    • C. Edelmann

    Lectures Pages: 552 - 555

15. Modelling the dielectric function of thin films measured by spectroscopic ellipsometry: determination of microstructure and density

    • T. Haage
    • U. I. Schmidt
    • H. Oechsner

    Lectures Pages: 556 - 558

16. Depth-resolved investigation of the element and compound inventory of aerosol particles from outdoor air

    • J. W. G. Bentz
    • J. Goschnick
    • H. J. Ache

    Lectures Pages: 559 - 564

17. MCs⁺ secondary ion and sputtering yields of oxygen-exposed semiconductors and glasses

    • M. Haag
    • H. Gnaser
    • H. Oechsner

    Lectures Pages: 565 - 569

18. Radio-frequency glow discharge ion source for high resolution mass spectrometry

    • A. I. Saprykin
    • F.-G. Melchers
    • H.-J. Dietze

    Poster Sessions Pages: 570 - 574

19. Surface analysis using ultrashort laser pulses and time-of-flight mass spectrometry

    • M. Schütze
    • C. Trappe
    • H. Kurz

    Poster Sessions Pages: 575 - 577

20. Simultaneous analysis of low-Z impurities in the near-surface region of solid materials by heavy ion elastic recoil detection (HIERD)

    • S. Grigull
    • R. Behrisch
    • M. Harz

    Poster Sessions Pages: 578 - 581

21. Quantitative elastic recoil detection (ERD)

    • A. Bergmaier
    • G. Dollinger
    • T. Faestermann

    Poster Sessions Pages: 582 - 584

22. Analytical techniques with a nuclear microprobe

    • J. Adamczewski
    • H. Röcken
    • F. Bruhn

    Poster Sessions Pages: 585 - 588

23. Investigation of high-temperature-oxidation of metals by infrared-reflection-absorption spectroscopy (IRAS)

    • T. Scherübl
    • L. K. Thomas

    Poster Sessions Pages: 589 - 593

24. A concept of a scanning positron microscope

    • K. Uhlmann
    • W. Triftshäuser
    • G. Karwasz

    Poster Sessions Pages: 594 - 597

25. Rapid determination of erosion rates with electron beam SNMS

    • J. Goschnick
    • M. Fichtner
    • H. J. Ache

    Poster Sessions Pages: 598 - 602

26. Analysis and classification of individual outdoor aerosol particles with SIMS time-of-flight mass spectrometry

    • J. W. G. Bentz
    • J. Goschnick
    • A. Benninghoven

    Poster Sessions Pages: 603 - 608

27. A multisource image processing environment in surface analysis

    • S. D. Böhmig
    • K. W. Brandl
    • H. Störi

    Poster Sessions Pages: 609 - 613

28. Surface analysis of sol-gel coatings on glass by secondary neutral mass spectrometry

    • R. Ambos
    • E. Rädlein
    • G. H. Frischat

    Poster Sessions Pages: 614 - 618

29. Optimization of large area pulsed laser deposition of YBaCuO thin films by SNMS depth profiling and rutherford backscattering

    • H. Börner
    • H. Hochmuth
    • M. Lorenz

    Poster Sessions Pages: 619 - 624

30. Interface studies on magnetron-sputtered SnO₂-films

    • H.-J. Michel
    • H. Leiste
    • J. Halbritter

    Poster Sessions Pages: 625 - 630

31. Application of an improved thermodynamic description of multilayer surface compositions of binary alloys

    • W. Hofer
    • L. Z. Mezey

    Poster Sessions Pages: 631 - 633

32. Investigation on structure and morphology of the thermally treated glassy alloy (Fe,Cr)₈₀(P,C,Si)₂₀ by means of ESCA and SEM/EDXA

    • A. Lippitz
    • K. Forkel
    • R. Stodolski

    Poster Sessions Pages: 634 - 638

33. Comparative composition analysis of SiO_x and SiN_x thin films by AES, EDX and RBS

    • I. Sieber
    • A. Schöpke
    • B. Selle

    Poster Sessions Pages: 639 - 641

34. Characterization of polymeric light emitting diodes by SIMS depth profiling analysis

    • G. Sauer
    • M. Kilo
    • D. Haarer

    Poster Sessions Pages: 642 - 646

35. Ex-situ XPS-investigation of the interface between PE-CVD SiO₂ and wet chemically etched MO-CVD epitaxial layers of In_0.53Ga_0.47As

    • M. Procop
    • K. Wandel
    • R. Verucchi

    Poster Sessions Pages: 647 - 654

36. Influence of different correction models on investigations of carbonaceous insulating films by electron beam X-ray microanalysis

    • W. Baumann
    • K. Weise
    • G. Marx

    Poster Sessions Pages: 655 - 656

37. Adsorption and characterization of molecular adhesion promoter monolayers on iron surfaces under UHV conditions

    • C. Reinartz
    • W. Fürbeth
    • M. Stratmann

    Poster Sessions Pages: 657 - 660

38. Interaction of water with clean and oxygen precovered nickel surfaces

    • M. Schulze
    • R. Reißner
    • W. Kuch

    Poster Sessions Pages: 661 - 665

39. Investigation of corrosion processes on cleavage edges of potash-lime-silica glasses by atomic force microscopy

    • I. Schmitz
    • T. Prohaska
    • M. Grasserbauer

    Poster Sessions Pages: 666 - 669

40. In-situ investigation of surface processes on AlGaAs/GaAs cleavage edges as studied by atomic force microscopy

    • T. Prohaska
    • G. Friedbacher
    • W. Schlapp

    Poster Sessions Pages: 670 - 674

41. Scanning Auger analysis for the clarification of oxidation and interdiffusion processes during laser ablation of YBa₂Cu₃O_7-x on alloy/oxide substrates

    • M. R. Maier
    • H. Viefhaus
    • H. J. Grabke

    Poster Sessions Pages: 675 - 677

42. Influence of N, C and S on the initial stage of oxidation of Fe-20Cr single crystals

    • R. Dennert
    • H. J. Grabke
    • H. Viefhaus

    Poster Sessions Pages: 678 - 683

43. SAM/AES analysis of grain boundaries in zirconia ceramics

    • E. M. Moser
    • M. Metzger
    • L. J. Gauckler

    Poster Sessions Pages: 684 - 689

44. Investigation of surface topography, morphology and structure of amorphous carbon films by AFM and TEM

    • H.-J. Scheibe
    • D. Drescher
    • A. Mensch

    Poster Sessions Pages: 690 - 694

45. Raman characterization of amorphous carbon films

    • H.-J. Scheibe
    • D. Drescher
    • P. Alers

    Poster Sessions Pages: 695 - 697

46. AFM investigation of silicon substrates for chemical vapour deposition of diamond films

    • G. M. Fuchs
    • G. Friedbacher
    • B. Lux

    Poster Sessions Pages: 698 - 701

47. Investigations on microstructure, composition and properties of PECVD TiN_x-coatings

    • J. Klosowski
    • I. Endler
    • D. Schläfer

    Poster Sessions Pages: 702 - 706

48. Characterization of thin alumina films prepared by metal-organic chemical vapour deposition (MOCVD) by high resolution SEM, (AR)XPS and AES depth profiling

    • W. Lisowski
    • A. H. J. van den Berg
    • V. A. C. Haanappel

    Poster Sessions Pages: 707 - 712

49. Analysis of the morphology and the optical properties of sputtered molybdenum particles

    • R. Joerger
    • K. Forcht
    • U. Weimar

    Poster Sessions Pages: 713 - 717

50. Surface morphology and electrical properties of copper thin films prepared by MOCVD

    • M. Becht
    • K.-H. Dahmen
    • A. Baiker

    Poster Sessions Pages: 718 - 722