1. Development of methods and instruments for optical ellipsometry at the Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences

   • E. V. Spesivtsev
   • S. V. Rykhlitskii
   • V. A. Shvets

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 419 - 425

2. Growing of HgCdTe heterostructures with in situ ellipsometric control

   • V. A. Shvets
   • N. N. Mikhailov
   • S. A. Dvoretskii

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 426 - 435

3. Emitters based on semiconductor Bragg microcavities

   • V. A. Haisler
   • I. A. Derebezov
   • I. I. Ryabtsev

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 436 - 441

4. Effect of electron trapping centers on electrical and photoelectric properties of PbSnTe : In

   • A. E. Klimov
   • V. N. Shumsky

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 442 - 451

5. Formation of type-II InAs/GaSb strained short-period superlattices for IR photodetectors by molecular beam epitaxy

   • E. A. Emel’yanov
   • D. F. Feklin
   • V. V. Preobrazhenskii

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 452 - 458

6. Oxidation kinetics of a silicon surface in a plasma of oxygen with inert gases

   • A. Kh. Antonenko
   • V. A. Volodin
   • D. V. Marin

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 459 - 464

7. Optical properties and morphology of diamond-like films obtained in a supersonic flow of a hydrocarbon plasma

   • S. N. Svitasheva
   • G. A. Pozdnyakov
   • Yu. V. Nastaushev

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 465 - 471

8. Ellipsometric monitoring in label-free microarray biotechnologies

   • V. V. Vlasov
   • A. N. Sinyakov
   • V. P. Bessmel’tsev

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 472 - 481

9. Estimation of the ultimate efficiency of a three-pin solar cell based on the GaAs/Si heterostructure

   • D. O. Kuznetsov
   • E. G. Tishkovskii
   • D. M. Legan

   Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 482 - 484

10. Dependences of the optical characteristics of Al _x Ga_1−x N films on the substrate composition and polarity

    • S. N. Svitasheva
    • K. S. Zhuravlev

    Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 485 - 489

11. Modeling the formation of silicon nanoclusters during annealing SiO _x layers

    • E. A. Mikhant’ev
    • I. G. Neizvestnyi
    • N. L. Shvarts

    Physical and Engineering Fundamentals of Microelectronics and Optoelectronics 28 January 2012 Pages: 490 - 497

12. Infrared scanning microscope with high spatial resolution

    • V. M. Bazovkin
    • I. V. Mzhel’skii
    • V. G. Polovinkin

    Automatic Control Systems in Scientific Research and Industry 28 January 2012 Pages: 498 - 502

13. Calibration of photodetectors in IR microscopes

    • G. L. Kuryshev
    • I. V. Mzhel’skii
    • V. G. Polovinkin

    Automatic Control Systems in Scientific Research and Industry 28 January 2012 Pages: 503 - 507

14. Application of uncooled microbolometer detector arrays for recording radiation of the terahertz spectral range

    • M. A. Dem’yanenko
    • D. G. Esaev
    • V. V. Gerasimov

    Automatic Control Systems in Scientific Research and Industry 28 January 2012 Pages: 508 - 512

15. Application of ellipsometry for studying bio-organic media

    • M. I. Voevoda
    • S. E. Pel’tek
    • K. P. Mogil’nikov

    Automatic Control Systems in Scientific Research and Industry 28 January 2012 Pages: 513 - 518

16. Automated system for measuring electrical and recombination-diffusion parameters of charge carriers in p-type mercury-cadmium-tellurium films

    • B. Ya. Kostyuchenko
    • D. V. Kombarov
    • D. Yu. Protasov

    Automatic Control Systems in Scientific Research and Industry 28 January 2012 Pages: 519 - 525