Asic design of adaptive threshold denoise DWT chip Luo FengWu ShunjunZhang Linrang Papers Pages: 1 - 7
Image wavelet denoising using the robust local threshold Lin KezhengZhou HongyuLi Dianpu Papers Pages: 8 - 13
Side-looking echo data transform to squint mode SAR imaging Guo YongmeiHong WenMao Shiyi Papers Pages: 14 - 20
The realization of the PPP autofocus method in PFA for spotlight mode SAR imaging Fu WenxianHong WenLi Shaohong Papers Pages: 21 - 29
Detection of ship wakes in SAR image using rotated window radon transform Chen YiJin Yaqui Papers Pages: 30 - 36
Three dimensional digitization of human head by fusing structured light and contours Jin GangLi DehuaHu Bing Papers Pages: 37 - 42
A hybrid interference cancellation scheme for blind multiuser detection in multipath fading channels Fu HaiyangTao NaiyongZhao Chunming Papers Pages: 43 - 49
A study on hot-carrier-induced gate oxide breakdown in partially depleted SIMOX MOSFET’s Liu HongxiaHao YueZhu Jiangang Papers Pages: 50 - 56
Subspace method for blind identification of CDMA time-varying channels Liu YulinPeng Qicong Letters Pages: 61 - 67
Induction of decision trees based on a fuzzy neural network Tang BinHu GuangruiMao Xiaoquan Letters Pages: 68 - 70
A real-time C-V clustering algorithm for WEB-mining Li HaiyingZhuang ZhenquanWan Ke Letters Pages: 71 - 75
Compensation for the effects of mutual coupling on the performance of adaptive arrays Gao XueHu HongfeiFu Demin Letters Pages: 76 - 80
Effects of random errors on the sidelobe for the linear array Cheng GangLin WeiLin Shiming Letters Pages: 81 - 83
Hybrid MM/MoL approach for analyzing a coaxial FED monopole antenna Sun BaohuaJi YicaiLiu Qizhong Letters Pages: 84 - 88
Analysis of the effect of the truncated scan plane in time-domain near-field measurements Hu HongfeiGao XueFu Demin Letters Pages: 89 - 93
Improvement of expression for excitation by an electric dipole in GTEM cell Ren LiehuiChen Zhiyu Letters Pages: 94 - 98
Classification of MPSK signals using cumulant invariants Yang ShaoquanChen Weidong Letters Pages: 99 - 103
Forward gated-diode method for directly measuring stress-induced interface traps in NMOSFET/SOI Huang AihuaHe JinJia Lin Letters Pages: 104 - 107