Regimes of X-ray phase-contrast imaging with perfect crystals T. E. GureyevS. W. Wilkins OriginalPaper Pages: 545 - 552
Imaging of biological objects in the plane-wave diffraction scheme V. N. IngalE. A. Beliaevskaya OriginalPaper Pages: 553 - 560
X-ray diffraction study of porous silicon layers etched on (111)-orientedp + substrate G. KowalskiJ. GronkowskiA. Brzozowski OriginalPaper Pages: 561 - 570
Phase-contrast hard X-ray microtomography by Bragg-Fresnel optics Y. HartmanV. KohnI. Snigireva OriginalPaper Pages: 571 - 576
Comparison between different X-ray diffraction methods to extract strains in metallic multilayers S. LabatO. ThomasG. Patrat OriginalPaper Pages: 577 - 583
Influence of free electrons and point defects on the lattice parameters and thermal expansion of gallium nitride M. LeszczynskiH. TeisseyreJ. Domagala OriginalPaper Pages: 585 - 590
Integrated X-ray substructure analysis of plastically deformed beryllium single crystals C. MayP. Klimanek OriginalPaper Pages: 591 - 598
Anomalous X-ray scattering from bulk microdefects D. MogilyanskyE. Gartstein OriginalPaper Pages: 599 - 607
XRPD application for laser-treated surface of Fe-based alloys study A. V. Nedolya OriginalPaper Pages: 609 - 615
Contributions of multipole terms to the photoelectric yield in X-ray standing-wave measurements I. A. VartanyantsJ. Zegenhagen OriginalPaper Pages: 617 - 624
Characterization of microdefects in GaAs crystals with high-resolution X-ray diffractometry E. Zielińska-RohozińskaT. SłupińskiJ. Borowski OriginalPaper Pages: 625 - 635