X-ray topographic studies of organic and non-linear optical materials P. J. HalfpennyJ. N. SherwoodG. S. Simpson OriginalPaper Pages: 123 - 135
Kinetic properties of dislocations in semiconductors revealed by X-ray topography K. Sumino OriginalPaper Pages: 137 - 146
High-resolution imaging of electronic devices using line modified-asymmetric crystal topography (LM-ACT) R. W. ArmstrongW. T. BeardX. J. Zhang OriginalPaper Pages: 147 - 152
Quantitative analysis of screw dislocations in 6H−SiC single crystals M. DudleyW. SiV. Tsvetkov OriginalPaper Pages: 153 - 164
Study of residual strains in wafer crystals by means of lattice tilt mapping C. FerrariD. KorytarJ. Kumar OriginalPaper Pages: 165 - 173
X-ray topographic study of twins in Nd x Y(1−x)Al3(BO3)4 crystal X. B. HuS. S. JiangS. Gennari OriginalPaper Pages: 175 - 180
Synchrotron X-ray topographic study of strain in silicon wafers with integrated circuits M. KarilahtiT. TuomiP. McNally OriginalPaper Pages: 181 - 184
X-ray topographic investigation of tungstate flux-grown KTiOAsO4 crystals W. J. LiuS. S. JiangS. Gennari OriginalPaper Pages: 185 - 193
Enhanced possibilities of section topography at a third-generation synchrotron radiation facility C. MedranoP. RejmánkováI. Matsouli OriginalPaper Pages: 195 - 203
Triple-axis X-ray diffraction study of polishing damage in III-V semiconductors C. D. MooreI. PapeB. K. Tanner OriginalPaper Pages: 205 - 212
X-ray study of GaAs/Ge heterostructures: relationship between interfacial defects and growth process M. PuteroN. BurleN. Guelton OriginalPaper Pages: 213 - 217
X-ray topography of complicated cross-section sapphire shaped crystals I. L. Shul’pinaP. I. AntonovV. M. Krymov OriginalPaper Pages: 219 - 225
The images of misfit dislocations in Bragg-case synchrotron section topography W. WierzchowskiK. WieteskaW. Graeff OriginalPaper Pages: 227 - 232
Interference effects in Bragg-case synchrotron section topography of elastically bent silicon implanted crystals K. WieteskaW. WierzchowskiW. Graeff OriginalPaper Pages: 233 - 239
Reduction of misfit dislocation density in strained Inx Gal−x As heterostructures via growth on patterned GaAs (001) substrate W. ZengS. S. JiangG. Salviati OriginalPaper Pages: 241 - 246
Treatment of the heat-load—associated contrast in synchrotron radiation topography F. ZontoneL. Mancini OriginalPaper Pages: 247 - 256
Reciprocal space mapping for semiconductor substrates and device heterostructures Mark S. GoorskyK. M. MatneyT. R. Block OriginalPaper Pages: 257 - 266
Application of X-ray diffraction in Laue geometry to imperfect near-surface layers R. N. KyuttT. S. Argunova OriginalPaper Pages: 267 - 275
High-resolution X-ray diffraction study of highly mismatched III–V heterostructures by analysis of the layer Bragg peak width C. FerrariL. FrancesioS. Gennari OriginalPaper Pages: 277 - 284
X-ray diffraction peak profiles from heteroepitaxial structures with misfit dislocations V. M. KaganerR. OpitzB. Jenichen OriginalPaper Pages: 285 - 292
Effect of uniaxial stress on the lattice spacing of silicon at low temperatures A. KohnoZ. LuA. Okazaki OriginalPaper Pages: 293 - 298
Modelling imperfections of epitaxial heterostructures by means of X-ray diffraction analysis Q. LiuW. ProstF. J. Tegude OriginalPaper Pages: 299 - 304
High-resolution X-ray diffraction of silicon at low temperatures Z. LuK. MunakataA. Okazaki OriginalPaper Pages: 305 - 311
X-ray investigation of strain-compensated GaAs: C/AlAs: C distributed Bragg reflectors A. MazuelasR. HeyH. T. Grahn OriginalPaper Pages: 313 - 320
New methods for depth profiling of heterostructures by X-ray diffraction M. O. MöllerT. GerhardG. Landwehr OriginalPaper Pages: 321 - 328
High-resolution X-ray diffraction characterisation of piezoelectric InGaAs/GaAs multiquantum wells and superlattices on (111)B GaAs A. Sanz-HervásM. LópezE. Muñoz OriginalPaper Pages: 329 - 337
Determination of the deformation state of HgSe/ZnTe layers P. SchäferH. BergerD. Schikora OriginalPaper Pages: 339 - 346
Pendellösung fringes of silicon at low temperatures Y. SoejimaT. EtoA. Okazaki OriginalPaper Pages: 347 - 353
Reciprocal space mapping on Si1−x C x epilayers and Si n /C/Si n superlattices J. StanglS. ZerlauthG. Bauer OriginalPaper Pages: 355 - 360
Characterization of SiGe HBT-structures by double-and triple-crystal diffractometry P. Zaumseil OriginalPaper Pages: 361 - 367
High-resolution X-ray diffraction investigation of crystal perfection and relaxation of GaAs/InGaAs/GaAs quantum wells depending on MOVPE growth conditions U. ZeimerF. BuggeM. Weyers OriginalPaper Pages: 369 - 376
Lateral periodicity in highly-strained (GaIn)As/Ga(PAs) superlattices investigated by X-ray scattering techniques Y. ZhuangC. GianniniW. Stolz OriginalPaper Pages: 377 - 383
High-resolution X-ray diffraction from imperfect heterostructures E. ZolotoyabkoD. Parnis OriginalPaper Pages: 385 - 392
X-ray scattering from thin organic films and multilayers U. PietschT. A. BarberkaR. Stömmer OriginalPaper Pages: 393 - 402
Ge δ layer in Si(100) characterized by X-ray reflectivity, grazing incidence diffraction and standing-wave measurements U. BeckP. YangJ. R. Patel OriginalPaper Pages: 403 - 410
X-ray specular reflectivity and grazing incidence X-ray diffraction of new Langmuir-Blodgett multilayers C. GianniniL. TapferS. Roth OriginalPaper Pages: 411 - 417
X-ray reflectivity reciprocal space mapping of strained SiGe/Si superlattices V. HolýA. A. DarhuberG. Abstreiter OriginalPaper Pages: 419 - 428
Investigation of the interface roughness of GaAs single quantum wells by X-ray diffractometry, reflectivity and diffuse scattering B. JenichenR. HeyK. Ploog OriginalPaper Pages: 429 - 438
Interface study of W/Si multilayers with increasing number of periods M. JergelE. MajkováR. Senderák OriginalPaper Pages: 439 - 445
High-resolution X-ray scattering from CdMnTe/CdTe multiple quantum well structures C. R. LiB. K. TannerD. E. Ashenford OriginalPaper Pages: 447 - 454
Grazing-incidence diffraction on LiNbO3 under surface acoustic wave excitation W. SauerT. H. MetzgerE. Zolotoyabko OriginalPaper Pages: 455 - 463
Triple-axis diffractometry on GaN/Al2O3(001) and AlN/Al2O3(001) using a parabolically curved graded multilayer as analyzer R. StömmerT. MetzgerH. Göbel OriginalPaper Pages: 465 - 472
Glancing-incidence X-ray characterization of Nb/Pd multilayers M. A. TaglienteA. Del VecchioC. M. Falco OriginalPaper Pages: 473 - 480
Monolithic devices for high-resolution X-ray diffractometry and topography D. KorytárP. BoháčekP. Mikula OriginalPaper Pages: 481 - 488
A high-precision spectrometer for the absolute determination of X-ray absorption edges as calibration standards J. StümpelP. Becker OriginalPaper Pages: 489 - 500
Photoelectrons in X-ray standing-wave technique: potentialities in crystal subsurface layer investigation E. Kh. Mukhamedzhanov OriginalPaper Pages: 501 - 511
Wave-optical description of X-ray phase contrast images of weakly absorbing non-crystalline objects V. A. BushuevE. A. BellaevskayaV. N. Ingal OriginalPaper Pages: 513 - 520
Improved dynamical theory for X-ray reflectivity of ideal crystals of finite size at low and high incidence angles L. De CaroL. Tapfer OriginalPaper Pages: 521 - 529
X-ray dynamical diffraction on superlattice with unequal layer thicknesses A. A. DyshekovYu. P. KhapachevD. A. Tarasov OriginalPaper Pages: 531 - 536
X-ray diffraction study on the correlation between ordered domains size and ordering degree in InGaP/GaAs alloy layers L. FrancesioL. AlagnaM. Sauvage OriginalPaper Pages: 537 - 543