Optimization of an Anode Membrane with a Transmission-Type Target in a System of Soft X-Ray Sources for X-Ray Nanolithography P. Yu. GlagolevG. D. DeminN. A. Djuzhev THEORETICAL AND MATHEMATICAL PHYSICS 18 November 2020 Pages: 1709 - 1716
Features of Two-Dimensional Bifurcations during Dissipative Electron Tunneling in Arrays of Au Nanoparticles M. B. SemenovV. D. KrevchikI. M. Semenov THEORETICAL AND MATHEMATICAL PHYSICS 18 November 2020 Pages: 1717 - 1725
Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation M. M. BaryshevaS. Yu. ZuevN. I. Chkhalo ATOMIC AND MOLECULAR PHYSICS 18 November 2020 Pages: 1726 - 1735
Application of Novel Multilayer Normal-Incidence Mirrors for EUV Solar Spectroscopy S. V. KuzinA. A. RevaV. N. Polkovnikov PLASMA 18 November 2020 Pages: 1736 - 1739
Magnetic Resonance Force Spectroscopy of Magnetic Vortex Oscillations V. L. MironovE. V. SkorokhodovI. Yu. Pashen’kin SOLID STATE 18 November 2020 Pages: 1740 - 1743
An Atomic Force Microscopic Study of Resistive Switching Resonance Activation in ZrO2(Y) Films D. O. FilatovD. A. AntonovO. N. Gorshkov SOLID STATE 18 November 2020 Pages: 1744 - 1747
Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire L. A. FominI. V. MalikovB. A. Loginov SOLID STATE 18 November 2020 Pages: 1748 - 1754
Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph N. A. DjuzhevE. E. GusevM. A. Makhiboroda SOLID STATE 18 November 2020 Pages: 1755 - 1759
Using Atomic Force Microscopy in the Study of Superprotonic Crystals R. V. GainutdinovA. L. TolstikhinaI. P. Makarova PHYSICAL SCIENCE OF MATERIALS 18 November 2020 Pages: 1760 - 1766
Secondary-Ion Mass Spectroscopy for Analysis of the Implanted Hydrogen Profile in Silicon and Impurity Composition of Silicon-on-Insulator Structures N. D. AbrosimovaM. N. DrozdovS. V. Obolensky PHYSICAL SCIENCE OF MATERIALS 18 November 2020 Pages: 1767 - 1770
Morphology and Structure of Defected Niobium Oxide Nonuniform Arrays Formed by Anodizing Bilayer Al/Nb Systems A. PligovkaP. YuninE. Skorokhodov PHYSICAL SCIENCE OF MATERIALS 18 November 2020 Pages: 1771 - 1776
The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors B. A. GurovichK. E. Prikhod’koE. D. Ol’shanskii PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1777 - 1779
Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam S. A. GarakhinM. V. ZorinaN. I. Chkhalo PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1780 - 1785
The Smoothing Effect of Si Layers in Multilayer Be/Al Mirrors for the 17- to 31-nm Range R. S. PleshkovS. Yu. ZuevP. Jonnard PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1786 - 1791
Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility S. A. GarakhinM. M. BaryshevaN. I. Chkhalo PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1792 - 1799
The Microstructure of Transition Boundaries in Multilayer Mo/Be Systems R. M. SmertinV. N. PolkovnikovA. L. Trigub PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1800 - 1808
Multilayer Cr/Sc Mirrors with Improved Reflection for the “Water Transparency Window” Range V. N. PolkovnikovS. A. GarakhinN. I. Chkhalo PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1809 - 1813
A Track Membrane as a Phase Test Object for the X-Ray Spectrum Range A. V. MitrofanovA. V. PopovD. V. Prokopovich PHOTONICS 18 November 2020 Pages: 1814 - 1821
Deep X-Ray Reflectometry of Supermultiperiod A3B5 Structures with Quantum Wells Grown by Molecular-Beam Epitaxy L. I. GorayE. V. PirogovA. D. Bouravleuv PHYSICAL ELECTRONICS 18 November 2020 Pages: 1822 - 1827
Material Surface Treatment for Design of Composite Optical Elements M. V. ZorinaI. I. KuznetsovN. I. Chkhalo PHYSICAL ELECTRONICS 18 November 2020 Pages: 1828 - 1831
The Magnetoelectric Effect in Ferroelectric/Ferromagnetic Film Hybrid Systems with Easy-Plane and Easy-Axis Anisotropy N. S. GusevM. V. SapozhnikovP. A. Yunin PHYSICAL ELECTRONICS 18 November 2020 Pages: 1832 - 1836
Ion-Beam Methods for High-Precision Processing of Optical Surfaces I. G. ZabrodinM. V. ZorinaN. I. Chkhalo PHYSICAL ELECTRONICS 18 November 2020 Pages: 1837 - 1845
Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy I. D. EvsikovS. V. Mit’koG. D. Demin PHYSICAL ELECTRONICS 18 November 2020 Pages: 1846 - 1852
An Investigation of the Effect of Colchicine on Living Fibroblasts by Atomic Force and Confocal Microscopy M. M. KhalisovV. A. PenniyaynenB. V. Krylov PHYSICS FOR SCIENCES OF LIFE 18 November 2020 Pages: 1853 - 1858
Microwave Volt–Impedance Spectroscopy of Semiconductors A. N. ReznikN. V. VostokovV. I. Shashkin EXPERIMENTAL INSTRUMENTS AND TECHNIQUE 18 November 2020 Pages: 1859 - 1865
Contact Stiffness Measurements with an Atomic Force Microscope A. V. AnkudinovM. M. Khalisov EXPERIMENTAL INSTRUMENTS AND TECHNIQUE 18 November 2020 Pages: 1866 - 1872
Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method M. N. ToropovA. A. AkhsakhalyanYu. M. Tokunov EXPERIMENTAL INSTRUMENTS AND TECHNIQUE 18 November 2020 Pages: 1873 - 1879