1. Optimization of an Anode Membrane with a Transmission-Type Target in a System of Soft X-Ray Sources for X-Ray Nanolithography

   • P. Yu. Glagolev
   • G. D. Demin
   • N. A. Djuzhev

   THEORETICAL AND MATHEMATICAL PHYSICS 18 November 2020 Pages: 1709 - 1716

   

2. Features of Two-Dimensional Bifurcations during Dissipative Electron Tunneling in Arrays of Au Nanoparticles

   • M. B. Semenov
   • V. D. Krevchik
   • I. M. Semenov

   THEORETICAL AND MATHEMATICAL PHYSICS 18 November 2020 Pages: 1717 - 1725

   

3. Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation

   • M. M. Barysheva
   • S. Yu. Zuev
   • N. I. Chkhalo

   ATOMIC AND MOLECULAR PHYSICS 18 November 2020 Pages: 1726 - 1735

   

4. Application of Novel Multilayer Normal-Incidence Mirrors for EUV Solar Spectroscopy

   • S. V. Kuzin
   • A. A. Reva
   • V. N. Polkovnikov

   PLASMA 18 November 2020 Pages: 1736 - 1739

   

5. Magnetic Resonance Force Spectroscopy of Magnetic Vortex Oscillations

   • V. L. Mironov
   • E. V. Skorokhodov
   • I. Yu. Pashen’kin

   SOLID STATE 18 November 2020 Pages: 1740 - 1743

   

6. An Atomic Force Microscopic Study of Resistive Switching Resonance Activation in ZrO₂(Y) Films

   • D. O. Filatov
   • D. A. Antonov
   • O. N. Gorshkov

   SOLID STATE 18 November 2020 Pages: 1744 - 1747

   

7. Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire

   • L. A. Fomin
   • I. V. Malikov
   • B. A. Loginov

   SOLID STATE 18 November 2020 Pages: 1748 - 1754

   

8. Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph

   • N. A. Djuzhev
   • E. E. Gusev
   • M. A. Makhiboroda

   SOLID STATE 18 November 2020 Pages: 1755 - 1759

   

9. Using Atomic Force Microscopy in the Study of Superprotonic Crystals

   • R. V. Gainutdinov
   • A. L. Tolstikhina
   • I. P. Makarova

   PHYSICAL SCIENCE OF MATERIALS 18 November 2020 Pages: 1760 - 1766

   

10. Secondary-Ion Mass Spectroscopy for Analysis of the Implanted Hydrogen Profile in Silicon and Impurity Composition of Silicon-on-Insulator Structures

    • N. D. Abrosimova
    • M. N. Drozdov
    • S. V. Obolensky

    PHYSICAL SCIENCE OF MATERIALS 18 November 2020 Pages: 1767 - 1770

    

11. Morphology and Structure of Defected Niobium Oxide Nonuniform Arrays Formed by Anodizing Bilayer Al/Nb Systems

    • A. Pligovka
    • P. Yunin
    • E. Skorokhodov

    PHYSICAL SCIENCE OF MATERIALS 18 November 2020 Pages: 1771 - 1776

    

12. The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors

    • B. A. Gurovich
    • K. E. Prikhod’ko
    • E. D. Ol’shanskii

    PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1777 - 1779

    

13. Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam

    • S. A. Garakhin
    • M. V. Zorina
    • N. I. Chkhalo

    PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1780 - 1785

    

14. The Smoothing Effect of Si Layers in Multilayer Be/Al Mirrors for the 17- to 31-nm Range

    • R. S. Pleshkov
    • S. Yu. Zuev
    • P. Jonnard

    PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1786 - 1791

    

15. Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility

    • S. A. Garakhin
    • M. M. Barysheva
    • N. I. Chkhalo

    PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1792 - 1799

    

16. The Microstructure of Transition Boundaries in Multilayer Mo/Be Systems

    • R. M. Smertin
    • V. N. Polkovnikov
    • A. L. Trigub

    PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1800 - 1808

    

17. Multilayer Cr/Sc Mirrors with Improved Reflection for the “Water Transparency Window” Range

    • V. N. Polkovnikov
    • S. A. Garakhin
    • N. I. Chkhalo

    PHYSICS OF NANOSTRUCTURES 18 November 2020 Pages: 1809 - 1813

    

18. A Track Membrane as a Phase Test Object for the X-Ray Spectrum Range

    • A. V. Mitrofanov
    • A. V. Popov
    • D. V. Prokopovich

    PHOTONICS 18 November 2020 Pages: 1814 - 1821

    

19. Deep X-Ray Reflectometry of Supermultiperiod A₃B₅ Structures with Quantum Wells Grown by Molecular-Beam Epitaxy

    • L. I. Goray
    • E. V. Pirogov
    • A. D. Bouravleuv

    PHYSICAL ELECTRONICS 18 November 2020 Pages: 1822 - 1827

    

20. Material Surface Treatment for Design of Composite Optical Elements

    • M. V. Zorina
    • I. I. Kuznetsov
    • N. I. Chkhalo

    PHYSICAL ELECTRONICS 18 November 2020 Pages: 1828 - 1831

    

21. The Magnetoelectric Effect in Ferroelectric/Ferromagnetic Film Hybrid Systems with Easy-Plane and Easy-Axis Anisotropy

    • N. S. Gusev
    • M. V. Sapozhnikov
    • P. A. Yunin

    PHYSICAL ELECTRONICS 18 November 2020 Pages: 1832 - 1836

    

22. Ion-Beam Methods for High-Precision Processing of Optical Surfaces

    • I. G. Zabrodin
    • M. V. Zorina
    • N. I. Chkhalo

    PHYSICAL ELECTRONICS 18 November 2020 Pages: 1837 - 1845

    

23. Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy

    • I. D. Evsikov
    • S. V. Mit’ko
    • G. D. Demin

    PHYSICAL ELECTRONICS 18 November 2020 Pages: 1846 - 1852

    

24. An Investigation of the Effect of Colchicine on Living Fibroblasts by Atomic Force and Confocal Microscopy

    • M. M. Khalisov
    • V. A. Penniyaynen
    • B. V. Krylov

    PHYSICS FOR SCIENCES OF LIFE 18 November 2020 Pages: 1853 - 1858

    

25. Microwave Volt–Impedance Spectroscopy of Semiconductors

    • A. N. Reznik
    • N. V. Vostokov
    • V. I. Shashkin

    EXPERIMENTAL INSTRUMENTS AND TECHNIQUE 18 November 2020 Pages: 1859 - 1865

    

26. Contact Stiffness Measurements with an Atomic Force Microscope

    • A. V. Ankudinov
    • M. M. Khalisov

    EXPERIMENTAL INSTRUMENTS AND TECHNIQUE 18 November 2020 Pages: 1866 - 1872

    

27. Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method

    • M. N. Toropov
    • A. A. Akhsakhalyan
    • Yu. M. Tokunov

    EXPERIMENTAL INSTRUMENTS AND TECHNIQUE 18 November 2020 Pages: 1873 - 1879