1. Magnetic structure and magnetoresistance of patterned epitaxial iron thin films: The influence of shape and magnetocrystalline anisotropy

   • L. A. Fomin
   • I. V. Malikov
   • G. M. Mikhailov

   Thin Films 21 September 2008 Pages: 283 - 295

2. Role of deep-level centers in compensated semi-insulating GaAs

   • V. V. Katsoev
   • L. V. Katsoev
   • E. A. Il’ichev

   Materials and Microstructure Characterization 21 September 2008 Pages: 296 - 301

3. Synthesis and use of anodic borosilicate diffusion sources

   • I. L. Baranov
   • L. V. Tabulina
   • Yu. A. Shostak

   Materials and Microstructure Characterization 21 September 2008 Pages: 302 - 307

4. Investigation into the statistical nature of Bell’s inequalities

   • Yu. I. Bogdanov

   Quantum-Computing Devices 21 September 2008 Pages: 308 - 321

5. Electrode geometry as dependent on electrolyte temperature in thick Cu film electrodeposition for making tunnel multilayer structures

   • L. B. Jangidze
   • A. N. Tavkhelidze
   • R. G. Gulyaev

   Process Technologies 21 September 2008 Pages: 322 - 326

6. Influence of metallization impedance on the current distribution along the conducting tracks from a FET operated in saturation

   • V. A. Sergeev

   Process Technologies 21 September 2008 Pages: 327 - 333

7. Sign of bipolar-magnetotransistor sensitivity as dependent on device structure

   • R. D. Tikhonov

   Solid-State Devices 21 September 2008 Pages: 334 - 345