1. The 50th Anniversary of the Ministry of Defense's 22 TsNIII Research Institute: Its Contributions to the National Microelectronics

   • V. A. Telets

   Personalia Pages: 269 - 271

2. Structural and Luminescent Properties of SiO _x N _y (Si) Nanocomposite Films

   • V. G. Baru
   • S. Bayliss
   • O. F. Shevchenko

   Nanostructure Characterization Pages: 272 - 278

3. Mossbauer-Spectroscopy Characterization of Nanostructured Magnetic Materials

   • N. P. Aksenova
   • M. A. Chuev

   Nanostructure Characterization Pages: 279 - 294

4. Sustaining Mechanisms of the ECR Heating of Electrons in Low-Pressure Microwave Plasmas under Magnetic Multipole Confinement

   • A. B. Petrin

   Nanostructure Characterization Pages: 295 - 308

5. Tip-Shape Reconstruction for a Laterally Vibrating SPM Probe

   • A. P. Chuklanov
   • A. A. Bukharaev
   • P. A. Borodin

   Materials and Microstructure Characterization Pages: 309 - 315

6. Method for the Microwave Measurement of Carrier Lifetime in Lightly Doped Silicon Ingots

   • P. A. Borodovskii
   • A. F. Buldygin
   • E. V. Chernyavskii

   Materials and Microstructure Characterization Pages: 316 - 324

7. ESR Study of P-doped, Zn-compensated Si Single Crystals

   • S. N. Dobryakov
   • B. V. Kornilov
   • V. V. Privezentsev

   Process Technologies Pages: 325 - 327

8. Engineering Approach to CMOS-Logic Optimization Allowing for Internal Capacitances and On-Chip Interconnections

   • A. V. Butuzov
   • G. V. Kristovskii

   Circuit Analysis and Synthesis Pages: 328 - 338