1. Editorial

   • Arthur Willoughby

   EditorialNotes Pages: i - i

2. Impurity-induced disordering in III–V multi-quantum wells and superlattices

   • I. Harrison

   Review Pages: 1 - 28

3. Annealing-induced dislocation loops in Si-doped GaAs-AIAs superlattices

   • N. Baba Ali
   • I. Harrison
   • M. Henini

   Papers Pages: 29 - 37

4. Electrical behaviour of the MnO₂-doped ZnO-Bi₂O₃ system

   • Bi-Shiou Chiou
   • Ming-Chih Chung

   Papers Pages: 38 - 42

5. Electrical and spectral studies of modified solid semiconductors

   • S. M. Shaaban
   • M. M. El-Desoky
   • M. B. Sayed

   Papers Pages: 43 - 46

6. Agglomeration problems in the formation of FeSi₂ from Fe-Si thin-film couples

   • D. Snell
   • D. G. Ivey

   Papers Pages: 47 - 54

7. An experimental approach for growth rate determination of LCVD-written aluminium stripes

   • V. Shanov
   • C. Popov
   • G. Peev

   Papers Pages: 55 - 58

8. Optical non-linear property of Au colloid-doped glass and the laser irradiation stability

   • K. Kadono
   • T. Sakaguchi
   • H. Tanaka

   Papers Pages: 59 - 61

9. Semi-insulating iron-doped indium phosphide grown by low-pressure metal-organic chemical vapour deposition

   • C. C. Wu
   • M. S. Feng
   • C. Y. Chang

   Papers Pages: 62 - 66

10. Field-dependent changeover from current-to voltage-limiting characteristics by non-linear n-type BaTiO₃ ceramics

    • V. Ravi
    • T. R. N. Kutty

    Papers Pages: 67 - 73

11. An equivalent circuit model for dielectrics: polymeric materials

    • H. S. B. Elayyan
    • S. N. Al-Refaie

    Papers Pages: 74 - 76

12. Microstructural properties of Pt-doped YBa₂Cu₃O_7−x high-T _c superconductor prepared by melting method

    • Jong-Hyun Park
    • Hyoung-Wook Kim
    • Jin-Tae Song

    Papers Pages: 77 - 82

13. Chemical processing and microstructure of piezoelectric lead titanate ceramics

    • M. L. Calzada
    • J. de Frutos

    Papers Pages: 83 - 88

14. Localized melting induced by rapid annealing correlated with the space distribution of A type microdefects in silicon Czochralski-grown wafers

    • A. Y. Usenko

    Papers Pages: 89 - 92