Volume 16, Issue 11-12 | Journal of Materials Science: Materials in Electronics

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Volume 16, Issue 11-12

November 2005

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10 articles in this issue

Photoconductivity methods in materials research
Monica Brinza
Jan Willekens
Guy J. Adriaenssens
Review Pages: 703 - 713
Effect of ramping-up rate on film thickness for spin-on processing
Dunbar P. Birnie III
Steven K. Hau
David M. Kaz
OriginalPaper Pages: 715 - 720
Effect of temperature on X-ray, IR and magnetic properties of nickel ferrite prepared by oxalate co-precipitation method
R. M. More
T. J. Shinde
P. N. Vasambekar
OriginalPaper Pages: 721 - 724
Effect of sintering time on electrical characteristics and DC accelerated aging behaviors of Zn-Pr-Co-Cr-Dy oxide-based varistors
Choon-Woo Nahm
Byoung-Chul Shin
OriginalPaper Pages: 725 - 732
A study of cadmium mercury telluride (CMT) thin film structures: some physical observations and characteristics
S. H. Mane
V. S. Karande
L. P. Deshmukh
OriginalPaper Pages: 733 - 739
A comparative study of different thick photoresists for MEMS applications
E. Koukharenko
M. Kraft
N. Hollinshead
OriginalPaper Pages: 741 - 747
Effect of external electric field on the grain growth of barium titanate in N₂ atmosphere
Hong-Ri Jin
Seok-Hyun Yoon
Joo-Hwan Han
OriginalPaper Pages: 749 - 752
Carbon nanotube enhanced diffraction efficiency in dye-doped liquid crystal
S. Ghosh
G. O. Carlisle
OriginalPaper Pages: 753 - 759
Characterization of polystyrene and doped polymethylmethacrylate thin layers
T. Podgrabinski
E. Hrabovská
V. Hnatowicz
OriginalPaper Pages: 761 - 765
Ultrasonic measurements of microelectronic resins
E. Martin
M. Saint-Paul
A. Clément
OriginalPaper Pages: 767 - 772