Volume 29, Issue 4

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August 2013

Special Issue on Defect and Fault Tolerance

Issue Editors:

Massimo Violante,
Prashant Joshi

14 articles in this issue

Editorial
Vishwani D. Agrawal
EditorialNotes 14 August 2013 Pages: 453 - 453
Test Technology Newsletter

News 02 August 2013 Pages: 455 - 456
A Library-Based Early Soft Error Sensitivity Analysis Technique for SRAM-Based FPGA Design
C. Thibeault
Y. Hariri
F. Z. Tazi
OriginalPaper 24 July 2013 Pages: 457 - 471
Neural Network Guided Spatial Fault Resilience in Array Processors
Suraj Sindia
Vishwani D. Agrawal
OriginalPaper 25 July 2013 Pages: 473 - 483
A Fault Tolerant Hierarchical Network on Chip Router Architecture
M. H. Neishaburi
Zeljko Zilic
OriginalPaper 15 August 2013 Pages: 485 - 497
Process-Variation and Temperature Aware SoC Test Scheduling Technique
Nima Aghaee
Zebo Peng
Petru Eles
OriginalPaper 01 May 2013 Pages: 499 - 520
Efficient Worst-Case Temperature Evaluation for Thermal-Aware Assignment of Real-Time Applications on MPSoCs
Lars Schor
Iuliana Bacivarov
Lothar Thiele
OriginalPaper 18 August 2013 Pages: 521 - 535
High Efficiency Time Redundant Hardened Latch for Reliable Circuit Design
Rahebeh Niaraki Asli
Saeideh Shirinzadeh
OriginalPaper 11 June 2013 Pages: 537 - 544
Timing-Error-Detecting Dual-Edge-Triggered Flip-Flop
Kazuteru Namba
Takashi Katagiri
Hideo Ito
OriginalPaper 19 July 2013 Pages: 545 - 554
An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis
Yongcai Ao
Yibing Shi
Yanjun Li
OriginalPaper 14 June 2013 Pages: 555 - 565
Prognostics of Analog Filters Based on Particle Filters Using Frequency Features
Min Li
Weiming Xian
Houjun Wang
OriginalPaper 29 May 2013 Pages: 567 - 584
A Cost-efficient Input Vector Monitoring Concurrent On-line BIST Scheme Based on Multilevel Decoding Logic
Tie-Bin Wu
Heng-Zhu Liu
Hai-Ming Sun
OriginalPaper 12 May 2013 Pages: 585 - 600
Memory Reliability Improvement Based on Maximized Error-Correcting Codes
Valentin Gherman
Samuel Evain
Yannick Bonhomme
OriginalPaper 08 August 2013 Pages: 601 - 608
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller
Y. Ren
S.-T. Shi
N. W. van Vonno
OriginalPaper 23 May 2013 Pages: 609 - 616

Volume 29, Issue 4

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