1. Editorial

   • Vishwani D. Agrawal

   Editorial Board Pages: 607 - 607

2. Test Technology Technical Council Newsletter

   • A. Ivanov

   Legacy Pages: 609 - 610

3. Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids

   • Chintan Patel
   • Ernesto Staroswiecki
   • Jim Plusquellic

   OriginalPaper Pages: 611 - 623

4. On Faster I _DDQ Measurements

   • C. Thibeault

   OriginalPaper Pages: 625 - 635

5. A Low Power Pseudo-Random BIST Technique

   • Nadir Z. Basturkmen
   • Sudhakar M. Reddy
   • Irith Pomeranz

   OriginalPaper Pages: 637 - 644

6. Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed Coefficients

   • Janusz Rajski
   • Jerzy Tyszer

   OriginalPaper Pages: 645 - 657

7. 2003 Annual Index

   Other Index Pages: 659 - 670