1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 22 September 2018 Pages: 507 - 508

2. Test Technology Newsletter

   News 14 September 2018 Pages: 509 - 510

   

3. An Efficient SAT-Based Test Generation Algorithm with GPU Accelerator

   • Muhammad Osama
   • Lamya Gaber
   • Hanafy Mahmoud

   OriginalPaper 30 August 2018 Pages: 511 - 527

   

4. Real Time Fault Diagnosis with Tests of Uncertain Quality for Multimode Systems and its Application in a Satellite Power System

   • Shigang Zhang
   • Long Wang
   • Yongmin Yang

   OriginalPaper 19 September 2018 Pages: 529 - 545

   

5. Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP

   • Vladimir Chepelev
   • Yury Parfenov
   • Yan-zhao Xie

   OriginalPaper 08 September 2018 Pages: 547 - 557

   

6. Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories

   • Shyue-Kung Lu
   • Shang-Xiu Zhong
   • Masaki Hashizume

   OriginalPaper 14 September 2018 Pages: 559 - 570

   

7. Impact of Aging on the Reliability of Delay PUFs

   • Naghmeh Karimi
   • Jean-Luc Danger
   • Sylvain Guilley

   OriginalPaper 20 August 2018 Pages: 571 - 586

   

8. Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoT

   • Weize Yu
   • Yiming Wen
   • Jia Chen

   OriginalPaper 24 August 2018 Pages: 587 - 598

   

9. Analytical Low Frequency NBTI Compact Modeling with H₂ Locking and Electron Fast Capture and Emission

   • J. Qing
   • Y. Zeng
   • Y. L. Shi

   OriginalPaper 19 September 2018 Pages: 599 - 605

   

10. High Performance Modified Static Segment Approximate Multiplier based on Significance Probability

    • R. Jothin
    • C. Vasanthanayaki

    OriginalPaper 04 September 2018 Pages: 607 - 614