Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead Ujjwal GuinDaniel DiMaseMohammad Tehranipoor OriginalPaper 12 February 2014 Pages: 9 - 23
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment Ujjwal GuinDaniel DiMaseMohammad Tehranipoor OriginalPaper 15 January 2014 Pages: 25 - 40
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits M. FavalliM. Dalpasso OriginalPaper 28 February 2014 Pages: 41 - 55
A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction of 3D Wafer-on-Wafer Stacked ICs Bei ZhangVishwani D. Agrawal OriginalPaper 12 January 2014 Pages: 57 - 75
Low Power Memory Built in Self Test Address Generator Using Clock Controlled Linear Feedback Shift Registers K. Murali KrishnaM. Sailaja OriginalPaper 13 February 2014 Pages: 77 - 85
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers Ahmed Amine RekikFlorence AzaïsPascal Nouet OriginalPaper 06 December 2013 Pages: 87 - 100
Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal Coupling Junpeng FengMarvin Onabajo OriginalPaper 13 December 2013 Pages: 101 - 109
Clock Faults Induced Min and Max Delay Violations D. RossiM. OmañaT. M. Mak OriginalPaper 15 December 2013 Pages: 111 - 123
Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path Delay Sushmita Kadiyala RaoRyan RobucciChintan Patel OriginalPaper 12 December 2013 Pages: 125 - 147
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser Y. RenA.-L. HeB. L. Bhuva OriginalPaper 09 January 2014 Pages: 149 - 154
