1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 20 August 2011 Pages: 425 - 426

2. Test Technology Newsletter

   News 20 July 2011 Pages: 427 - 428

   

3. Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip

   • Kihyuk Han
   • Joonsung Park
   • Jacob A. Abraham

   OriginalPaper 06 May 2011 Pages: 429 - 439

   

4. Histogram-Based Calibration of Capacitor Mismatch and Comparator Offset for 1-Bit/Stage Pipelined ADCs

   • Xuan-Lun Huang
   • Ping-Ying Kang
   • Jiun-Lang Huang

   OriginalPaper 25 June 2011 Pages: 441 - 453

   

5. An Output Response Analyzer Circuit for ADC Built-in Self-Test

   • Hsin-Wen Ting

   OriginalPaper 08 July 2011 Pages: 455 - 464

   

6. Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation

   • Gurusubrahmaniyan Subrahmaniyan Radhakrishnan
   • Sule Ozev

   OriginalPaper 12 April 2011 Pages: 465 - 476

   

7. An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation

   • Haijun Sun
   • Yongjia Zeng
   • Zhibiao Shao

   OriginalPaper 17 June 2011 Pages: 477 - 484

   

8. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling

   • Carlos Iván Castro Márquez
   • Edgar Leonardo Romero Tobar
   • Wang Jiang Chau

   OriginalPaper 03 May 2011 Pages: 485 - 503

   

9. Functional Verification of DMA Controllers

   • Michelangelo Grosso
   • Wilson Javier Perez Holguin
   • Jaime Velasco Medina

   OriginalPaper 09 April 2011 Pages: 505 - 516

   

10. A Fault Detection Scheme for the FPGA Implementation of SHA-1 and SHA-512 Round Computations

    • Mohsen Bahramali
    • Jin Jiang
    • Arash Reyhani-Masoleh

    OriginalPaper 02 August 2011 Pages: 517 - 530

    

11. A Java Framework to Specify Faultloads for Fault Injection Campaigns

    • Ruthiano Simioni Munaretti
    • Taisy Silva Weber
    • Bruno Coswig Fiss

    OriginalPaper 09 April 2011 Pages: 531 - 539

    

12. Exploring the Limitations of Software-based Techniques in SEE Fault Coverage

    • José Rodrigo Azambuja
    • Samuel Pagliarini
    • Fernanda Lima Kastensmidt

    OriginalPaper 09 April 2011 Pages: 541 - 550

    

13. Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps

    • Luiz Fernando Gonçalves
    • Jefferson Luiz Bosa
    • Renato Ventura Henriques

    OriginalPaper 12 April 2011 Pages: 551 - 564

    

14. Test Data Compression Using Selective Sparse Storage

    • Ling Zhang
    • Ji-shun Kuang
    • Zhi-qiang You

    OriginalPaper 23 July 2011 Pages: 565 - 577