1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 15 April 2011 Pages: 95 - 95

2. Test Technology Newsletter

   News 13 April 2011 Pages: 97 - 98

   

3. Balanced Secure Scan: Partial Scan Approach for Secret Information Protection

   • Michiko Inoue
   • Tomokazu Yoneda
   • Hideo Fujiwara

   OriginalPaper 22 February 2011 Pages: 99 - 108

   

4. Construction and Analysis of Augmented Time Compactors

   • Emil Gizdarski

   OriginalPaper 22 March 2011 Pages: 109 - 122

   

5. Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems

   • Desta Tadesse
   • R. Iris Bahar
   • Joel Grodstein

   OriginalPaper 09 March 2011 Pages: 123 - 136

   

6. Efficient Generation of Stimuli for Functional Verification by Backjumping Across Extended FSMs

   • Giuseppe Di Guglielmo
   • Luigi Di Guglielmo
   • Graziano Pravadelli

   OriginalPaper 29 March 2011 Pages: 137 - 162

   

7. Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters

   • Le Jin

   OriginalPaper 27 January 2011 Pages: 163 - 175

   

8. Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor

   • Román Mozuelos
   • Yolanda Lechuga
   • Salvador Bracho

   OriginalPaper 30 March 2011 Pages: 177 - 192

   

9. An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology

   • Chi-Hsuan Cheng
   • James Chien-Mo Li

   OriginalPaper 08 February 2011 Pages: 193 - 201

   

10. Analysis of Resistive Open Defects in Drowsy SRAM Cells

    • Afshin Nourivand
    • Asim J. Al-Khalili
    • Yvon Savaria

    OriginalPaper 01 March 2011 Pages: 203 - 213

    

11. Fault Tolerant Single Error Correction Encoders

    • Juan Antonio Maestro
    • Pedro Reviriego
    • Dhiraj K. Pradhan

    OriginalPaper 30 March 2011 Pages: 215 - 218