1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 20 November 2010 Pages: 595 - 596

2. Test Technology Newsletter

   News 06 November 2010 Pages: 597 - 598

   

3. On-Chip Delay Measurement Based Response Analysis for Timing Characterization

   • Ramyanshu Datta
   • Antony Sebastine
   • Jacob A. Abraham

   OriginalPaper 27 November 2010 Pages: 599 - 619

   

4. An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis

   • Aymen Ladhar
   • Mohamed Masmoudi

   OriginalPaper 23 October 2010 Pages: 621 - 639

   

5. Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture

   • Jari Hannu
   • Teuvo Saikkonen
   • Markku Moilanen

   OriginalPaper 02 November 2010 Pages: 641 - 658

   

6. Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time

   • Prashant Dubey
   • Akhil Garg
   • Shashank Mahajan

   OriginalPaper 06 November 2010 Pages: 659 - 666

   

7. Chiba Scan Delay Fault Testing with Short Test Application Time

   • Kazuteru Namba
   • Hideo Ito

   OriginalPaper 23 October 2010 Pages: 667 - 677

   

8. Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead

   • Usha Sandeep Mehta
   • Kankar S. Dasgupta
   • Nirnjan M. Devashrayee

   OriginalPaper 26 October 2010 Pages: 679 - 688

   

9. A Framework for Automated Detection of Power-related Software Errors in Industrial Verification Processes

   • Stefano Gandini
   • Walter Ruzzarin
   • Alberto Tonda

   OriginalPaper 06 November 2010 Pages: 689 - 697