1. Editorial

   • V. D. Agrawal

   EditorialNotes 24 March 2010 Pages: 145 - 145

2. Test Technology Newsletter

   News 20 March 2010 Pages: 147 - 148

   

3. Guest Editorial

   • Prabhat Mishra

   EditorialNotes 09 March 2010 Pages: 149 - 150

4. RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences

   • Hongxia Fang
   • Krishnendu Chakrabarty
   • Hideo Fujiwara

   OriginalPaper 06 January 2010 Pages: 151 - 164

   

5. Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation

   • Maheshwar Chandrasekar
   • Nikhil P. Rahagude
   • Michael S. Hsiao

   OriginalPaper 04 February 2010 Pages: 165 - 176

   

6. Qualifying Serial Interface Jitter Rapidly and Cost-effectively

   • Yongquan Fan
   • Zeljko Zilic

   OriginalPaper 06 January 2010 Pages: 177 - 193

   

7. Fault Table Computation on GPUs

   • Kanupriya Gulati
   • Sunil P. Khatri

   OriginalPaper 12 February 2010 Pages: 195 - 209

   

8. Defining and Providing Coverage for Assertion-Based Dynamic Verification

   • Jason G. Tong
   • Marc Boulé
   • Zeljko Zilic

   OriginalPaper 12 February 2010 Pages: 211 - 225

   

9. Analysis of Scheduled Latency Insensitive Systems with Periodic Clock Calculus

   • Bin Xue
   • Sandeep K. Shukla

   OriginalPaper 27 March 2010 Pages: 227 - 242

   

10. Learning from Constraints for Formal Property Checking

    • In-Ho Moon
    • Kevin Harer

    OriginalPaper 05 February 2010 Pages: 243 - 259

    

11. Finding Multiple Equivalence-Preserving Transformations in Combinational Circuits through Incremental-SAT

    • Gianpiero Cabodi
    • Leandro Dipietro
    • Sergio Nocco

    OriginalPaper 30 January 2010 Pages: 261 - 278

    

12. Experience with Widening Based Equivalence Checking in Realistic Multimedia Systems

    • Sven Verdoolaege
    • Martin Palkovič
    • Francky Catthoor

    OriginalPaper 23 January 2010 Pages: 279 - 292