1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 15 November 2008 Pages: 505 - 506

2. Test Technology Newsletter

   News 20 November 2008 Pages: 507 - 508

3. Self-Testing Embedded Borden t-UED Code Checkers for t = 2 ^k q − 1 with q = 2 ^m  − 1

   • Steffen Tarnick

   OriginalPaper 26 June 2008 Pages: 509 - 527

   

4. A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines

   • Roberto Gómez
   • Alejandro Girón
   • Victor H. Champac

   OriginalPaper 11 October 2008 Pages: 529 - 538

   

5. An Automotive CD-Player Electro-Mechanics Fault Simulation Using VHDL-AMS

   • Mariagrazia Graziano
   • Massimo Ruo Roch

   OriginalPaper 21 June 2008 Pages: 539 - 553

   

6. Online Testing of MEMS Based on Encoded Stimulus Superposition

   • N. Dumas
   • Z. Xu
   • A. Richardson

   OriginalPaper 30 October 2008 Pages: 555 - 566

   

7. Linearity Testing of A/D Converters Using Selective Code Measurement

   • Shalabh Goyal
   • Abhijit Chatterjee

   OriginalPaper 25 June 2008 Pages: 567 - 576

   

8. Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

   • Swarup Bhunia
   • Hamid Mahmoodi
   • Kaushik Roy

   OriginalPaper 24 June 2008 Pages: 577 - 590

   

9. An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR

   • Myung-Hoon Yang
   • Yongjoon Kim
   • Sungho Kang

   Letter 01 October 2008 Pages: 591 - 595