1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 23 August 2008 Pages: 421 - 421

2. Test Technology Newsletter October 2008

   News 13 August 2008 Pages: 423 - 424

3. Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors

   • Egas Henes Neto
   • Gilson Wirth
   • Fernanda Lima Kastensmidt

   OriginalPaper 11 January 2008 Pages: 425 - 437

   

4. Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan Cells

   • Ozgur Sinanoglu

   OriginalPaper 04 January 2008 Pages: 439 - 448

   

5. Comparison of NIST and Wavelet Transform Test Point Selection Methods For a Programmable Gain Amplifier

   • Xinsong Zhang
   • Simon S. Ang
   • Chandra Carter

   OriginalPaper 22 May 2008 Pages: 449 - 460

   

6. Noise-Insensitive Digital BIST for any PLL or DLL

   • Stephen Sunter
   • Aubin Roy

   OriginalPaper 01 February 2008 Pages: 461 - 472

   

7. Reverse Breakdown Voltage Measurement for Power P⁺NN⁺ Rectifier

   • Guangyu Huang
   • Cher Ming Tan

   OriginalPaper 11 January 2008 Pages: 473 - 479

   

8. Controllability of Static CMOS Circuits for Timing Characterization

   • Ramyanshu Datta
   • Ravi Gupta
   • Manuel d’Abreu

   OriginalPaper 15 February 2008 Pages: 481 - 496

   

9. A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling

   • Erik Larsson
   • Zebo Peng

   Letter Open access 27 June 2008 Pages: 497 - 504