1. Editorial

   EditorialNotes 17 August 2006 Pages: 215 - 215

2. Test Technology Newsletter

   EditorialNotes 17 August 2006 Pages: 217 - 218

3. A Low-Cost Jitter Measurement Technique for BIST Applications

   • Jiun-Lang Huang
   • Jui-Jer Huang
   • Yuan-Shuang Liu

   OriginalPaper 18 July 2006 Pages: 219 - 228

4. A Novel RF Test Scheme Based on a DFT Method

   • Jee-Youl Ryu
   • Bruce C. Kim
   • Iboun Sylla

   OriginalPaper 13 July 2006 Pages: 229 - 237

5. An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults

   • Jack Smith
   • Tian Xia
   • Charles Stroud

   OriginalPaper 27 July 2006 Pages: 239 - 253

6. Defect Simulation Methodology for i_DDT Testing

   • Abhishek Singh
   • Jim Plusquellic
   • Chintan Patel

   OriginalPaper 20 July 2006 Pages: 255 - 272

7. Observability Statement Coverage Based on Dynamic Factored Use-Definition Chains for Functional Verification

   • Tao Lv
   • Jian-Ping Fan
   • Ling-Yi Liu

   OriginalPaper 26 June 2006 Pages: 273 - 285

8. ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions

   • Luigi Dilillo
   • Patrick Girard
   • Magali Hage-Hassan

   OriginalPaper 26 June 2006 Pages: 287 - 296

9. Combining Scan Test and Built-in Self Test

   • Markus Seuring

   OriginalPaper 26 June 2006 Pages: 297 - 299

10. Security Extension for IEEE Std 1149.1

    • Franc Novak
    • Anton Biasizzo

    OriginalPaper 26 June 2006 Pages: 301 - 303