An On-Chip Spectrum Analyzer for Analog Built-In Testing Marcia G. Méndez-RiveraAlberto Valdes-GarciaEdgar Sánchez-Sinencio OriginalPaper Pages: 205 - 219
Sine-Wave Signal Characterization Using Square-Wave and ΣΔ-Modulation: Application to Mixed-Signal BIST Diego VázquezGloria HuertasJosé L. Huertas OriginalPaper Pages: 221 - 232
Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply Current Swarup BhuniaArijit RaychowdhuryKaushik Roy OriginalPaper Pages: 243 - 255
Testing Biquad Filters under Parametric Shifts Using X-Y Zoning R. SanahujaV. BarconsJ. Figueras OriginalPaper Pages: 257 - 265
Detection and Evaluation of Deterministic Jitter Causes in CP-PLL’s Due to Macro Level Faults and Pre-Detection Using Simple Methods Martin John Burbidge OriginalPaper Pages: 267 - 281
Low Cost BIST for Static and Dynamic Testing of ADCs Maria Da Gloria FloresMarcelo NegreirosCristiano Benevento OriginalPaper Pages: 283 - 290
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications F. AzaïsS. BernardM. Renovell OriginalPaper Pages: 291 - 298
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs Carsten WegenerMichael Peter Kennedy OriginalPaper Pages: 299 - 310
Multi-VDD Testing for Analog Circuits José Pineda de GyvezGuido GronthoudRachid Amine OriginalPaper Pages: 311 - 322
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications Soumendu BhattacharyaAchintya HalderAbhijit Chatterjee OriginalPaper Pages: 323 - 339
