Abstract
Today’s market place for electronic (and non-electronic) goods places ever more stringent demands upon the producers, to construct and supply cost-effective products. The consumers for their part have become increasingly aware of the importance of reliability to the performance of the equipment which they purchase. Concurrently the economy has placed tight monetary constraints upon the consumers. This climate has led to an ongoing and thorough analysis of the many factors which contribute towards more cost-effective products. Thus many LCC models now exist. Of these a high proportion are based upon assumptions which are not mathematically justified. Since LCC has become an important tool in the procurement and study of systems it is necessary for the methodology to be soundly based. Similarly since there are potentially many regimes under which systems may be procured and operated, there are proportionately many LCC models. It is thus important that models have well defined spaces of validity, and also that the mathematical models are transparent (i.e. publicly justified). Only in this way can we expect the models to evolve towards more rigorous and credible representations.
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Abbreviations
- a:
-
desired availability
- A:
-
computed availability
- δ(t):
-
cumulative downtime in [o,t]
- δ*(t):
-
normalised cumulative downtime
- δij:
-
Kronecker delta = 1 i = j - 0 i ‡ j
- D.o.D:
-
Department of Defense (U.S.A.)
- E |.}:
-
Expectation operator E|x} = ∫ x dF
- F:
-
Probability distribution
- λ:
-
Failure rate of item under consideration
- LCC:
-
Life Cycle Cost
- µ:
-
Repair rate of item under consideration
- µf :
-
E |time to failure <∞ of item under consideration
- i µf :
-
E|time to failure for component i} <∞ repair
- µr :
-
E|time to replace <∞ of item under consideration repair
- i µr :
-
E |time to replace for component i} <∞
- M(t):
-
Cumulative number of failures in [o,t]
- M*(t):
-
Normalised cumulative number of failures in [o,t]
- Mi(t):
-
Cumulative number of failures of type i in [o,t]
- Mi* (t):
-
Normalised cumulative number of failures of type i in [o,t]
- M.O.D.:
-
Ministry of Defence (U.K.)
- ν(t):
-
Cumulative uptime
- ν*(t):
-
Normalised cumulative uptime
- N(0,l):
-
Normal distribution - mean=0, variance=1
- N(t):
-
Number of individuals in population at time t
- σ2f:
-
Var |time to failure } <∞ of item under consideration repair
- σ2r:
-
Var |time to replace} <∞ of item under consideration
- i σ2f:
-
Var |time to failure of component i} <∞
- S.N.R.:
-
Signal-to-Noise Ratio
- t:
-
Arbitrary time ≥ 0
- T:
-
Time interval
- Φ(X):
-
\({1 \over {\sqrt {2\pi } }}\int\limits_{ - \infty }^X {{e^{ - {u^2}/2}}du} \)
- Var |.}:
-
Variance operator E|(x-E|x})2} = E|X2} -E2|x}
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© 1983 Springer-Verlag Berlin Heidelberg
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de Neumann, B. (1983). Life Cycle Cost Models. In: Skwirzynski, J.K. (eds) Electronic Systems Effectiveness and Life Cycle Costing. NATO ASI Series, vol 3. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82014-4_27
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DOI: https://doi.org/10.1007/978-3-642-82014-4_27
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