Abstract
The structure of an Atomic force microscope (AFM) probe that integrates fast electrostatic actuation and highly sensitive optical interferometric detection of tip motion is described. The use of this so-called FIRAT probe for quantitative material characterization with high spatial resolution is demonstrated through contact and adhesion modeling. Time resolved interaction forces between the AFM tip and the sample surface is used to map material properties of several samples including silicon, polymer and carbon nanotubes. Non-resonant tapping mode operation of the FIRAT probe has also been demonstrated for use with existing commercial AFM systems.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
G. Binnig, C. F. Quate, and C. Gerber, Atomic force microscope, Phys. Rev. Lett. 56, 930 (1986)
M. E. Greene, C. R. Kinser, D. E. Kramer, L. S. C. Pingree, and M. C. Hersam, Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials, Microscopy Res. and Tech. 64, 415 (2004)
N. A. Burnham and R. J. Colton, Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope, J. Vac. Sci. Technol. A 7, 2906 (1989)
U. Rabe, K. Janser, and W. Arnold, Vibrations of free and surface-coupled atomic force microscope cantilevers: Theory and experiment, Rev. Sci. Instrum. 67, 3281 (1996)
K. Yamanaka and S. Nakano, Ultrasonic atomic force microscope with overtone excitation of cantilever, Jpn. J. Appl. Phys.,Part 1 35, 3787 (1996)
H. U. Krotil, T. Stifter, H. Waschipky, K. Weishaupt, S. Hild, and O. Marti, Pulsed force mode: a new method for the investigation of surface properties, Surf. Interf. Anal. 27, 336 (1999)
M. Balantekin and A. Atalar, Power dissipation analysis in tapping-mode atomic force microscopy, Phys. Rev. B 67, 193404 (2003)
O. Sahin, G. Yaralioglu, R. Grow, S. F. Zappe, A. Atalar, C. F. Quate, and O. Solgaard, High-resolution imaging of elastic properties using harmonic cantilevers, Sens. Actuators A 114, 183 (2004).
F. L. Degertekin, A. G. Onaran, M. Balantekin, W. Lee, N. A. Hall, and C. F. Quate, Sensor for direct measurement of interaction forces in probe microscopy, Appl. Phys. Lett. 87, 213109 (2005)
A. G. Onaran, M. Balantekin, W. Lee, W. L. Hughes, B. A. Buchine, R. O. Guldiken, Z. Parlak, C. F. Quate, and F. L. Degertekin, A new atomic force microscope probe with force sensing integrated readout and active tip, Rev. Sci. Instrum. 77, 23501 (2006)
B. Bhushan ed.Handbook of Micro/Nanotribology, (CRC, Boca Raton, Florida, 1999)
N. A. Burnham, R. J. Colton, and H. M. Pollock, Nanotechnology 4, 64 (1993).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2008 Springer Science+Business Media B.V.
About this paper
Cite this paper
Degertekin, F., Balantekin, M., Onaran, A. (2008). Quantitative Material Characterization and Imaging at Nanoscale Using a New AFM Probe. In: Akiyama, I. (eds) Acoustical Imaging. Acoustical Imaging, vol 29. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-8823-0_30
Download citation
DOI: https://doi.org/10.1007/978-1-4020-8823-0_30
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-8822-3
Online ISBN: 978-1-4020-8823-0
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)