Abstract
Fano resonance is analyzed by measuring the transmission and reflection from a photonic crystal slab containing a hexagonal symmetry of holes in silicon fabricated by electron beam lithography. The spectral features in the measured transmission and angle dependent reflection are in good agreement with those calculated using rigorous coupled wave analysis method (using DiffractMOD module of RSoft\(^{\mathrm {TM}}\)). This provides a convincing proof to this versatile and convenient out-of-plane measurement technique. In our photonic crystal, the quality factors measured at 1314, 1328, 1377, 1599, and 1630 nm are high and can be utilized for designing low-threshold micro-lasers and narrowband optical filters in the silicon slab platform.
Similar content being viewed by others
References
R. Gajic, R. Meisels, F. Kuchar, K. Hingerl, Opt. Express 13, 8596 (2005)
K.V. Ummer, R. Vijaya, J. Nanophoton. 11, 036005 (2017)
D. Chigrin, S. Enoch, C.M. Sotomayor Torres, G. Tayeb, Opt. Express 11, 1203 (2003)
K.V. Ummer, R. Vijaya, 13th Int. Conf. Fiber Opt. Photonics, OSA Tech. Dig. (Online) 1, 7 (2016)
R. Magnusson, S.S. Wang, Appl. Phys. Lett. 61, 1022 (1992)
P.R. Villeneuve, S. Fan, S.G. Johnson, J.D. Joannopoulos, IEE Proc. Optoelectron. 145, 384 (1998)
V.N. Astratov, I.S. Culshaw, R.M. Stevenson, D.M. Whittaker, M.S. Skolnick, T.F. Krauss, R.M. De La Rue, J. Lightw. Tech. 17, 2050 (1999)
U. Fano, Phys. Rev. 124, 1866 (1961)
S. Fan, W. Suh, J. Opt. Soc. Am. A 20, 569 (2003)
V.A. Fedotov, M. Rose, S.L. Prosvirnin, N. Papasimakis, N.I. Zheludev, Phys. Rev. Lett. 99, 147401 (2007)
B. Gallinet, O.J.F. Martin, Phys. Rev. B 83, 235427 (2011)
V. Giannini, Y. Francescato, H. Amrania, C.C. Phillips, S.A. Maier, Nano Lett. 11, 2835 (2011)
Y. Fan, Z. Wei, H. Li, H. Chen, C.M. Soukoulis, Phys. Rev. B 87, 115417 (2013)
N. Nguyen-Huu, M. Cada, Y. Ma, F. Che, J. Pistora, K. Yasumoto, Y. Ma, J. Lin, H. Maeda, J. Phys. D Appl. Phys. 50, 205105 (2017)
M.F. Limonov, M.V. Rybin, A.N. Poddubny, Y.S. Kivshar, Nat. Photonics 11, 543 (2017)
M. Imada, S. Noda, A. Chutinan, T. Tokuda, M. Murata, G. Sasaki, Appl. Phys. Lett. 75, 316 (1999)
A. Mekis, M. Meier, A. Dodabalapur, R.E. Slusher, J.D. Joannopoulos, Appl. Phys. A 69, 111 (1999)
Y. Yu, W. Xue, E. Semenova, K. Yvind, J. Mork, Nat. Photon. 11, 81 (2016)
X. Zhang, S. Choi, D. Wang, C.H. Naylor, A.T.C. Johnson, E. Cubukcu, Nano Lett. 17, 6715 (2017)
A.A. Erchak, D.J. Ripin, S. Fan, P. Rakich, J.D. Joannopoulos, E.P. Ippen, G.S. Petrich, L.A. Kolodziejski, Appl. Phys. Lett. 78, 563 (2001)
J.J. Wierer, A. David, M.M. Megens, Nat. Photon. 3, 163 (2009)
L. Chen, Z. Qiang, H. Yang, H. Pang, Z. Ma, Opt. Express 17, 4835 (2009)
Y. Shuai, D. Zhao, A. Singh Chadha, J.H. Seo, H. Yang, S. Fan, Z. Ma, W. Zhou, Appl. Phys. Lett. 103, 241106 (2013)
V. Pacradouni, W. Mandeville, A. Cowan, P. Paddon, J. Young, S. Johnson, Phys. Rev. B 62, 4204 (2000)
P. Paddon, J. Young, Phys. Rev. B 61, 2090 (2000)
A.R. Cowan, P. Paddon, V. Pacradouni, J.F. Young, J. Opt. Soc. Am. A 18, 1160 (2001)
T. Ochiai, K. Sakoda, Phys. Rev. B 64, 45108 (2001)
S.G. Tikhodeev, A.L. Yablonskii, E.A. Muljarov, N.A. Gippius, T. Ishihara, Phys. Rev. B 66, 451021 (2002)
S. Fan, J. Joannopoulos, Phys. Rev. B 65, 1 (2002)
N.A. Gippius, S.G. Tikhodeev, T. Ishihara, Phys. Rev. B Condens. Matter Mater. Phys. 72, 045138 (2005)
K. Koshino, Phys. Rev. B 67, 165213 (2003)
L. Prodan, P. Groß, R. Beigang, L. Kuipers, K.J. Boller, J. Phys. D Appl. Phys. 40, 5571 (2007)
N. Paraire, Y. Benachour, Appl. Phys. B 89, 245 (2007)
B.K. Ofori-Okai, P. Sivarajah, C.A. Werley, S.M. Teo, K.A. Nelson, New J. Phys. 16, 53003 (2014)
C. Blanchard, J.P. Hugonin, C. Sauvan, Phys. Rev. B 94, 155303 (2016)
Y. Yang, C. Peng, Y. Liang, Z. Li, S. Noda, Phys. Rev. Lett. 113, 37401 (2014)
B. Zhen, C.W. Hsu, L. Lu, A.D. Stone, M. Soljacic, Phys. Rev. Lett. 113, 257401 (2014)
X. Gao, C.W. Hsu, B. Zhen, X. Lin, J.D. Joannopoulos, M. Soljai, H. Chen, Sci. Rep. 6, 31908 (2016)
L. Li, J. Zhang, C. Wang, N. Zheng, H. Yin, Phys. Rev. A 96, 13801 (2017)
F. Monticone, A. Alu, New J. Phys. 19, 93011 (2017)
K.V. Ummer, R. Vijaya, J. Nanophoton. 9, 93086 (2015)
M.S. Reddy, S. Kedia, R. Vijaya, A.K. Ray, S. Sinha, I.D. Rukhlenko, M. Premaratne, IEEE Photonics J. 5, 4700409 (2013)
M.S. Reddy, R. Vijaya, I.E.E.E. Photon, Tech. Lett. 28, 833 (2016)
L. Ondic, M. Varga, I. Pelant, J. Valenta, A. Kromka, R.G. Elliman, Sci. Rep. 7, 5763 (2017)
Acknowledgements
K.V. Ummer thanks Ms. Suchita Yadav and Mr. Govind Kumar for their help during the experimental set-up. K.V. Ummer also thanks Dipak Rout for the technical help during the preparation of the manuscript. The fabrication work was carried out at the CeNSE, IISc Bangalore under INUP which is sponsored by DIT, MCIT, Government of India. The work was partially supported by (1) IRDE, Dehradun, India under the DRDO Nanophotonics program (ST-12/IRD-124), (2) DST, India under the India-Taiwan S&T co-operation project (GITA/DST/TWN/P-61/2014) and (3) SERB (EMR/2015/001450).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Ummer, K.V., Vijaya, R. Spectral characterization of silicon photonic crystal slab using out-of-plane light coupling arrangement. Appl. Phys. B 124, 136 (2018). https://doi.org/10.1007/s00340-018-7008-8
Received:
Accepted:
Published:
DOI: https://doi.org/10.1007/s00340-018-7008-8