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Progress in Nanoscale Characterization and Manipulation pp 381–477Cite as

In Situ TEM: Theory and Applications

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Part of the book series: Springer Tracts in Modern Physics ((STMP,volume 272))

Abstract

Transmission electron microscope (TEM) is one of the most powerful techniques to obtain the microstructure of materials. Equipped with energy dispersive X-ray (EDX) and electron energy loss spectroscopy (EELS), not only crystallographic structures but also chemical information at nano-scale, atomic scale and even sub-angstrom scale can be obtained.

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Authors and Affiliations

  1. Beijing, China

    Kun Zheng, Yihua Gao, Xuedong Bai, Renchao Che, Ze Zhang, Xiaodong Han, Yoshio Bando, Shize Yang, Enge Wang & Qi Cao

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  1. Kun Zheng
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  2. Yihua Gao
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  1. School of Mathematics and Physics, University of Science and Technology Beijing, Beijing, China

    Rongming Wang

  2. National Center for Nanoscience Technology, Beijing, China

    Chen Wang

  3. CRANN and AMBER, Trinity College Dublin, University of Dublin, Dublin, Ireland

    Hongzhou Zhang

  4. Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, New York, WA, USA

    Jing Tao

  5. Institute of Physics, Chinese Academy of Sciences, Beijing, China

    Xuedong Bai

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Zheng, K. et al. (2018). In Situ TEM: Theory and Applications. In: Wang, R., Wang, C., Zhang, H., Tao, J., Bai, X. (eds) Progress in Nanoscale Characterization and Manipulation. Springer Tracts in Modern Physics, vol 272. Springer, Singapore. https://doi.org/10.1007/978-981-13-0454-5_7

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