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Silicone Surface Science pp 319–353Cite as

Surface Analysis of Silicones

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Part of the book series: Advances in Silicon Science ((ADSS,volume 4))

Abstract

As many of the desirable performance differences of silicones are related to their surface properties, it is important to be able analyze their surfaces effectively. This chapter presents an overview of key surface analysis techniques that can provide information on the surface morphology, chemical composition and surface physical properties of silicone materials. These techniques are X-ray photoelectron spectroscopy, secondary ion mass spectrometry, scanning electron microscopy and scanning probe microscopy. Both fundamentals and applications to the analysis of silicones are covered. It is evident from a consideration of key examples that in many cases it is a combination of these analytical techniques that provides a clearer picture of the surface properties of silicones.

An erratum to this chapter can be found at http://dx.doi.org/10.1007/978-94-007-3876-8_14

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Authors and Affiliations

  1. Dow Corning Europe, Seneffe, Belgium

    Stuart Leadley

  2. Dow Corning Corporation, Midland, MI, USA

    Lesley-Ann O’Hare & Christopher McMillan

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  1. Michigan Molecular Institute, Midland, M, West Saint Andrews Road 1505, Midland, 48640, Michigan, USA

    Michael J. Owen

  2. Michigan Molecular Institute, Midland, M, St. Mary’s Dr. 2806, Midland, 48640, Michigan, USA

    Petar R. Dvornic

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Leadley, S., O’Hare, LA., McMillan, C. (2012). Surface Analysis of Silicones. In: Owen, M., Dvornic, P. (eds) Silicone Surface Science. Advances in Silicon Science, vol 4. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-3876-8_12

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