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Cleaved {110} Surfaces of III–V and II–VI Compound Semiconductors

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Semiconductor Surfaces and Interfaces

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 26))

Abstract

Compound semiconductors, which crystallize in the cubic zincblende structure, cleave along {110} planes. Such planes contain the same number of anions and cations per unit area and are thus intrinsically neutral. With {110} surfaces of compound semiconductors no reconstructions are observed but the surface atoms relax from the positions expected for a bulklike termination such that the cation-anion zigzag chains become tilted with the anions being raised. As a result of this relaxation, the total valence charge remains the same around surface and bulk atoms. The dangling-bond surface states are lower in energy at the surface anions than at the surface cations. The band-structure term of the total energy is thus lowered with respect to a bulklike termination when the dangling bonds are completely occupied at the anions but empty at the cations. The surface relaxation indeed shifts the cation dangling-bond band to above the conduction-band minimum. The lowering of the band-structure energy obviously overcompensates the strain energy correlated with the tilting of the cation-anion chains.

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© 2001 Springer-Verlag Berlin Heidelberg

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Mönch, W. (2001). Cleaved {110} Surfaces of III–V and II–VI Compound Semiconductors. In: Semiconductor Surfaces and Interfaces. Springer Series in Surface Sciences, vol 26. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04459-9_7

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  • DOI: https://doi.org/10.1007/978-3-662-04459-9_7

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-08748-6

  • Online ISBN: 978-3-662-04459-9

  • eBook Packages: Springer Book Archive

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