Abstract
Image Processing often involves convolutions and Fourier Transforms (DFT and FFT): these specific operations are well implemented by means of a systolic multi-pipeline structure.
Practical implementations require large pipelines, adopting highly integrated circuits that are prone to production defects and run-time faults; efficient fault-tolerance through reconfiguration is then required.
Still, the basic problem of concurrent (or semi-concurrent) testing must be solved prior to any reconfiguration step. Here, we prove how these structures allow to perform testing by a simple technique (based on the classical LSSD method) so that added circuits required due to testing functions is kept very limited.
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© 1989 Springer-Verlag Berlin Heidelberg
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Negrini, R., Sami, M.G., Scarabottolo, N., Stefanelli, R. (1989). Fault-Tolerance in Imaging-Oriented Systolic Arrays. In: Eckmiller, R., v.d. Malsburg, C. (eds) Neural Computers. Springer Study Edition, vol 41. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83740-1_6
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DOI: https://doi.org/10.1007/978-3-642-83740-1_6
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-50892-2
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