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A New Channel Calibration Method of Eddy Current Array Technology

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Theoretical and Mathematical Foundations of Computer Science (ICTMF 2011)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 164))

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Abstract

One of the preconditions of accurate defect feature extraction is the consistent channels of eddy current array testing equipment. This paper changes the problems of channel calibration into the regression analysis problems, and presents a new channel calibration method of eddy current array technology based on the crack features. Making use of the partial least-squares regression algorithm on the spline transform and the partial least-squares regression algorithm on the kernel function transform, the functions between the crack feature difference and amplitude of excitation, frequency of excitation, scan direction and detecting time, are set up. The experimental results show that the calibrated resolution of the partial least-squares regression algorithm on the spline transform is superior to the latter algorithm.

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References

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© 2011 Springer-Verlag Berlin Heidelberg

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Liu, B., Luo, FL., Pan, MC., Hou, LJ. (2011). A New Channel Calibration Method of Eddy Current Array Technology. In: Zhou, Q. (eds) Theoretical and Mathematical Foundations of Computer Science. ICTMF 2011. Communications in Computer and Information Science, vol 164. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-24999-0_29

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  • DOI: https://doi.org/10.1007/978-3-642-24999-0_29

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-24998-3

  • Online ISBN: 978-3-642-24999-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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